References
- B. Finet, G. Weber and R. Cloots: Mater. Lett., 2000, 43, 159–165.
- W. Suchanek and M. Yoshimura: J. Mater. Res., 1998, 13, 94–117.
- Y.-J. Zhang, L.-H. Zhou, D. Li, N.-C. Xue, X.-D. Xu and J.-H. Li: Chem. Phys. Lett., 2003, 376, 493–497.
- G. K. Lim, J. Wang, S. C. Ng and L. M. Gan: Langmuir, 1999, 15, 7472–7477.
- S. C. Tjong and H. Chen: Mater. Set Eng. R, 2004, R45, 1–88.
- M. C. Kua and S. K. Yen: Mater. Set Eng. C, 2002, C20, 153–160.
- B. D. Cullity: 'Elements of X-ray diffraction', 2nd edn, 47, 102, 105; 1978, Reading, MA, Addison-Wesley Publishing Company.
- S. V. Dorozhkin and M. Epple: Angew. Chem. Int. Ed., 2002, 41, 3130–3146.
- D. B. Williams and C. B. Carter: 'Transmission electron micro-scopy', 274, 283; 1996, New York, Plenum Press.