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Materials Science and Technology Volume 12, 1996 - Issue 1
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Articles

Optical investigation of deep defects in GaN epitaxial layers grown on 6H-SiC

K. Pressel
,
S. Nilsson
,
C. Wetzel
,
D. Volm
,
B. K. Meyer
,
I. Loa
,
P. Thurian
,
R. Heitz
,
A. Hoffmann
,
E. N. Mokhov
&
P. G. Baranov
 show all
Pages 90-93 | Published online: 19 Jul 2013

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