References
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- T. A. WHATLEY, D. J. COMAFORD and P. MILLER, “Small Area Depth Profiling with the Ion Microprobe,” STP-596, p. 115, American Society for Testing and Materials (1976).
- K. NAKAMURA, S. AOKI, Y. NAKAJIMA, H. DOI and H. TAMURA, “A New Analytical Technique for Insulating Materials by Means of an Ion Microanalyser,” Mass Spectros., 20, 1, 1 (1972).
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