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Technical Paper

Development of a Shielded Ion Microprobe Analyzer (SIMA) and Its Application to Fast Reactor Fuel Elements

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Pages 164-169 | Published online: 12 May 2017

References

  • K. NAKAMURA, Y. HIRATA, A. SHIBATA and H. TAMURA, “Surface Analysis of Insulating Materials by Means of Ion Microprobe Analyser,” Mass Spectros., 24, 2, 163 (1976).
  • C. E. JOHNSON, “Electron and Ion Microprobe Analysis of Irradiated Fuels,” Physical Aspects of Electron Microscopy and Micro., p. 373 (1975).
  • D. V. STEIDL and C. R. JOHNSON, “Ion Microprobe Studies of Surface Effects of Materials Related to Fission and Fusion Reactors,” Radiation Effects on Solid Surface, p. 158, American Chemical Society (1976).
  • T. A. WHATLEY, D. J. COMAFORD and P. MILLER, “Small Area Depth Profiling with the Ion Microprobe,” STP-596, p. 115, American Society for Testing and Materials (1976).
  • K. NAKAMURA, S. AOKI, Y. NAKAJIMA, H. DOI and H. TAMURA, “A New Analytical Technique for Insulating Materials by Means of an Ion Microanalyser,” Mass Spectros., 20, 1, 1 (1972).
  • H. LIEBL, “Ion Probe Microanalysis,” Sci. Instrum., 8, 797 (1975).

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