Advanced search
Publication Cover
Science and Technology of Advanced Materials Volume 18, 2017 - Issue 1
Submit an article Journal homepage
2,416
Views
16
CrossRef citations to date
0
Altmetric
Optical, magnetic and electronic device materials

Improved sensing characteristics of dual-gate transistor sensor using silicon nanowire arrays defined by nanoimprint lithography

Cheol-Min LimDepartment of Electronic Materials Engineering, Kwangwoon University, Seoul, Republic of Korea
,
In-Kyu LeeHazards Monitoring BioNano Research Center, Korea Research Institute of Bioscience & Biotechnology (KRIBB), Daejeon, Republic of Korea
,
Ki Joong LeeHazards Monitoring BioNano Research Center, Korea Research Institute of Bioscience & Biotechnology (KRIBB), Daejeon, Republic of Korea
,
Young Kyoung OhHazards Monitoring BioNano Research Center, Korea Research Institute of Bioscience & Biotechnology (KRIBB), Daejeon, Republic of Korea
,
Yong-Beom ShinHazards Monitoring BioNano Research Center, Korea Research Institute of Bioscience & Biotechnology (KRIBB), Daejeon, Republic of KoreaCorrespondence[email protected]
&
Won-Ju ChoDepartment of Electronic Materials Engineering, Kwangwoon University, Seoul, Republic of KoreaCorrespondence[email protected]
Pages 17-25 | Received 24 Apr 2016, Accepted 24 Oct 2016, Published online: 06 Jan 2017

Related Research Data

Improved sensing characteristics of dual-gate transistor sensor using silicon nanowire arrays defined by nanoimprint lithography
Source: Figshare
Improved sensing characteristics of dual-gate transistor sensor using silicon nanowire arrays defined by nanoimprint lithography
Source: Figshare

Linking provided by 

Related research

People also read lists articles that other readers of this article have read.

Recommended articles lists articles that we recommend and is powered by our AI driven recommendation engine.

Cited by lists all citing articles based on Crossref citations.
Articles with the Crossref icon will open in a new tab.