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Science and Technology of Advanced Materials Volume 18, 2017 - Issue 1
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Engineering and structural materials

In situ MEMS testing: correlation of high-resolution X-ray diffraction with mechanical experiments and finite element analysis

Andreas SchifferleHelbling Technik AG, Aarau, SwitzerlandCorrespondence[email protected]
,
Alex DommannEmpa, Swiss Federal Laboratories for Materials Science and Technology, Center for X-ray Analytics, Dübendorf, Switzerland
&
Antonia NeelsEmpa, Swiss Federal Laboratories for Materials Science and Technology, Center for X-ray Analytics, Dübendorf, Switzerland
Pages 219-230 | Received 08 Sep 2016, Accepted 12 Jan 2017, Published online: 31 Mar 2017

Related Research Data

In situ MEMS testing: correlation of high-resolution X-ray diffraction with mechanical experiments and finite element analysis
Source: Figshare
In situ MEMS testing: correlation of high-resolution X-ray diffraction with mechanical experiments and finite element analysis
Source: Figshare

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