Supplemental material
Science and Technology of Advanced Materials
Volume 19, 2018 - Issue 1
Optical, Magnetic and Electronic Device Materials
Basic properties mapping of anodic oxides in the hafnium–niobium–tantalum ternary system
Andrei Ionut MardareInstitute for Chemical Technology of Inorganic Materials, Johannes Kepler University Linz, Linz, Austria;Competence Centre for Electrochemical Surface Technology, Wiener Neustadt, AustriaCorrespondence[email protected]
http://orcid.org/0000-0003-4137-1994View further author information
http://orcid.org/0000-0003-4137-1994View further author information, Cezarina Cela MardareInstitute for Chemical Technology of Inorganic Materials, Johannes Kepler University Linz, Linz, Austria;Christian Doppler Laboratory for Combinatorial Oxide Chemistry, Institute for Chemical Technology of Inorganic Materials, Johannes Kepler University Linz, Linz, Austriahttp://orcid.org/0000-0001-8930-1560View further author information
http://orcid.org/0000-0001-8930-1560View further author information, , Silvia HuberInstitute for Chemical Technology of Inorganic Materials, Johannes Kepler University Linz, Linz, Austria;Christian Doppler Laboratory for Combinatorial Oxide Chemistry, Institute for Chemical Technology of Inorganic Materials, Johannes Kepler University Linz, Linz, Austriahttp://orcid.org/0000-0002-2143-1390View further author information
http://orcid.org/0000-0002-2143-1390View further author information & Achim Walter HasselInstitute for Chemical Technology of Inorganic Materials, Johannes Kepler University Linz, Linz, Austria;Competence Centre for Electrochemical Surface Technology, Wiener Neustadt, Austria;Christian Doppler Laboratory for Combinatorial Oxide Chemistry, Institute for Chemical Technology of Inorganic Materials, Johannes Kepler University Linz, Linz, Austriahttp://orcid.org/0000-0002-9816-6740View further author information
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