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Materials Research Letters Volume 5, 2017 - Issue 6
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Original Report

Si-integrated ultrathin films of phase-pure Y3Fe5O12 (YIG) via novel two-step rapid thermal anneal

Thomas E. GageDepartment of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN, USAView further author information
,
Prabesh DulalDepartment of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN, USAView further author information
,
Peter A. SolheidInstitute for Rock Magnetism, University of Minnesota, Minneapolis, MN, USAView further author information
,
David J. FlanniganDepartment of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN, USAView further author information
&
Bethanie J. H. StadlerDepartment of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN, USA;Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, USACorrespondence[email protected]
View further author information
Pages 379-385 | Received 27 Dec 2016, Published online: 01 Mar 2017

Related Research Data

Si-integrated ultrathin films of phase-pure Y3Fe5O12 (YIG) via novel two-step rapid thermal anneal
Source: Figshare
Si-integrated ultrathin films of phase-pure Y3Fe5O12 (YIG) via novel two-step rapid thermal anneal
Source: Figshare

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