Quality Technology & Quantitative Management, Volume 20, Issue 5 (2023)

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Quality Technology & Quantitative Management, Volume 20, Issue 5 (2023)

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Research Article

Article
A new Spk-based sample-size tightening sampling system for lot determination
Shih-Wen Liu & Zih-Huei Wang
Pages: 545-560
Published online: 21 Mar 2023
AbstractforA new Spk-based sample-size tightening sampling system for lot determination | Full Text | References | PDF (1.3 MB)
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Article
Reliability analysis of redundant retrial machining system subject to standby switching failure
Kuo-Hsiung Wang, Chia-Huang Wu & Tseng-Chang Yen
Pages: 561-576
Published online: 01 Jan 2023
AbstractforReliability analysis of redundant retrial machining system subject to standby switching failure | Full Text | References | PDF (2.2 MB)
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Article
Exponentially weighted moving average Lepage-type schemes based on the lower-order percentile of the run-length metrics and their use in monitoring time-occupancy in Google applications
Kok Ming Chan, Zhi Lin Chong & Amitava Mukherjee
Pages: 577-600
Published online: 16 Jan 2023
AbstractforExponentially weighted moving average Lepage-type schemes based on the lower-order percentile of the run-length metrics and their use in monitoring time-occupancy in Google applications | Full Text | References | PDF (6.4 MB)
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Article
Stochastic comparisons of conditional residual lifetimes with applications
Yiying Zhang
Pages: 601-632
Published online: 24 Oct 2022
AbstractforStochastic comparisons of conditional residual lifetimes with applications | Full Text | References | PDF (8.3 MB)
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Article
Performance analysis of cognitive wireless retrial queueing networks with admission control for secondary users
B. Krishna Kumar, R. Navaneetha Krishnan, R. Sankar & R. Rukmani
Pages: 633-670
Published online: 05 Dec 2022
AbstractforPerformance analysis of cognitive wireless retrial queueing networks with admission control for secondary users | Full Text | References | PDF (4.6 MB)
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Article
Combined class of distributions with an exponentiated Weibull family for reliability application
Minjae Park
Pages: 671-687
Published online: 06 Nov 2022
AbstractforCombined class of distributions with an exponentiated Weibull family for reliability application | Full Text | References | PDF (4.9 MB)
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