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Original Articles

Bayesian burn-in procedures for limited failure populations

Pages 2547-2555 | Published online: 14 Nov 2010
 

Bayesian burn-in procedures are developed for limited failure populations in which defective items fail soon after they are put into operation and non-defective ones never fail during the technological life of the items. Sequential schemes guaranteeing the prescribed quality of a product are derived based on prior information on the quality of a product and accumulated failure information up to the decision point. Numerical examples are provided.

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