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International Journal of Production Research Volume 40, 2002 - Issue 11
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Original Articles

Bayesian burn-in procedures for limited failure populations

Young Il Kwon
&
J. Bert Keats
Pages 2547-2555 | Published online: 14 Nov 2010

  • BAI , D. S. and KWON , Y. L. 1994 . An economic sequential screening procedure for limited failure population . Naval Research Logistics , 41 : 523 – 535 .
  • BARLOW , R. , MADANSKY , A. , PROSCHAN , F. and SCHEUR , E. 1968 . Statistical estimate procedures for the burn-in process . Technometrics , 10 : 51 – 62 .
  • BLUMENTHAL , S. and MARCUS , R. 1975 . Estimating population size with exponential failure . Journal of the American Statistical Association , 70 : 913 – 922 .
  • CHIEN , W. K. and Kuo , W. 1997 . A nonparametric Bayes approach to decide system burn-in time . Naval Research Logistics , 44 : 655 – 671 .
  • DISHON , M. and WEISS , G. H. 1973 . Burn-in programs for repairable systems . IEEE Transactions on Reliability , 22 : 265 – 267 .
  • DISHON , M. and WEISS , G. H. 1976 . A model for burn-in programs for components with eliminateable defects . IEEE Transactions on Reliability , 25 : 259 – 260 .
  • FAREWELL , V. T. 1982 . The use of mixture models for the analysis of survival data with long term survivors . Biometrics , 38 : 1041 – 1046 .
  • FAREWELL , V. T. 1986 . Mixture models in the survival analysis: are they worth the risk? . Canadian Journal of Statistics , 14 : 257 – 262 .
  • KUO , W. 1984 . Reliability enhancement through optimal burn-in . IEEE Transactions on Reliability , 33 : 145 – 156 .
  • LEEMIS , L. M. and BENEKE , M. 1990 . Burn-in models and methods: a review . IIE Transactions , 22 : 172 – 180 .
  • MARCUS , R. and BLUMENTHAL , S. 1974 . A sequential screening procedure . Technometrics , 16 : 229 – 234 .
  • MEEKER , W. Q. 1987 . Limited failure population life tests: application to integrated circuit reliability . Technometrics , 29 : 51 – 65 .
  • MENDENHALL , W. and HARDER , R. J. 1958 . Estimation of parameters of mixed exponentially distributed failure time distribution from censored life test data . Biometrien , 45 : 504 – 520 .
  • MI , J. 1997 . Warranty policies and burn-in . Naval Research Logistics , 44 : 199 – 209 .
  • NGUYEN , D. G. and MURTHY , D. N. P. 1982 . Optimal burn-in time to minimize cost for product sold under warranty . HE Transactions , 14 : 167 – 84 .
  • PANTIC , D. 1986 . Benefits of integrated circuit burn-in to obtain high reliability parts . IEEE Transactions on Reliability , 35 : 3 – 6 .
  • WHITBECK , C. W. and LEEMIS , L. M. 1989 . Component vs. system burn-in techniques for electronic equipment . IEEE Transactions on Reliability , 38 : 206 – 209 .

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