Publication Cover
The Journal of Photographic Science
Section B of The Photographic Journal
Volume 1, 1953 - Issue 1
6
Views
2
CrossRef citations to date
0
Altmetric
Original Articles

Direct Observation of Solid Surfaces at High Resolution by Reflection Electron Microscopy

Pages 12-20 | Received 05 Dec 1952, Published online: 22 Jul 2016
 

Abstract

A standard commercial transmission electron microscope has been modified for the direct examination of solid surfaces at high resolution by reflection. The geometry, resolution, contrast and depth of focus of the images obtained are briefly discussed. An investigation has been made of the types of specimen which may usefully be studied by the method. It is pointed out that its main value lies in the examination of very flat surfaces, e.g. high mechanical and electropolish, cleavage faces, and surfaces on which there are isolated features, e.g. cleavage and growth steps, overgrowths, etc., and features too large to be within the depth of focus of the optical microscope or within the range of transmission electron microscope replica methods. Among the specimens studied are cleavage features on zinc single crystals and mica, growth features on silicon carbide crystals, surface damage (scratches) produced by sliding. It is suggested that the method may be valuable for the examination of some biological specimens where replica methods are inappropriate.

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.