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Abstract
The paper discusses the quantitative evaluation of photographic X-ray diffraction patterns with steep density gradients by means of a converter coupled to a microdensitometer so as to yield tracings on which the ordinates are directly proportional to exposure or intensity values. Use is made of a standard transmission-exposure converter curve and the development of the method is particularly directed towards establishing a definite correlation between points of the converter curve and the corresponding transmission values on the photographic pattern