An Improved C-V Plotter For Semiconductor Measurements

Abstract

A versatile automatic C-V plotter using LM 1496 integrated circuit as the phase detector is described. The circuit plots C-V data for measurement frequencies ranging from 10 kHz—100 kHz with a 20-mV rms test signal. The performance of the circuit is checked against commercially available diodes. C-V plots have also been obtained at 10 kHz and 100 kHz on poorly-performing Si-Sn0₂ n-n⁺ heterojunction solar cells which indicate the presence of a high surface-state density.

Indexing Terms:

• Semiconductor Measurements
• C-V Plotter

Additional information

Notes on contributors

B. Seisu

Seishu, B was born at Vizag on 1958 Sept. 23 He obtained his MSc (Physics) degree with electronics in 1979 from Bangalore University, Bangalore. After a brief stay at SIRTDO, Ranchi where he worked on high stability voltage sources, he is now working for his PhD degree at the Materials Science Centre, IIT, Kharagpur. His research interests concern LPE growth and study of the optical properties of III—V semiconductors.