REFERENCES
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- Nicollian (E H) & Goetzberger (A). The Si-SiO2 Interface: Electrical Properties as Determined by the MIS Conductance Technique. The Bell Syst. Tech. Joul. 46, 6; 1967; 1055–1133.
- Shewchun (J) & Waxman (A). Automatic Plotting of Conductance and Capacitance of MIS Diodes or Any Two Terminal Complex Admittance. Rev. Scientific Instrum. 37, 9; 1966; 1195–1201.
- Forward (K E), Hasegawa (H) & Hartnagel (H L). An Automatic C-V Plotter. Joul. Phy. E. Scientific Instrum. 8, 1975; 487–489.
- Lue (J T). An Automatic C-V Plotter and Junction Parameter Measurements of MIS Schottky Barrier Diodes. J Solid-State Circuits. SC-13, 4; 1978; 510–514.