164
Views
4
CrossRef citations to date
0
Altmetric
Review Article

A Partially Filled Shorted Coaxial Line Technique for Material Relative Permittivity Determination

ORCID Icon, , &
 

Abstract

This paper presents a material relative permittivity extraction technique based on three measurements of two identical coaxial lines, terminated by a short-circuit configuration. The test cells have the same geometric dimensions but various lengths. The most extended fixture is partially filled with the sample under test to be measured in the scanned frequency [6–20] GHz. The measurement methodology is based on the use of the fixture form factor. The accuracy of the relative permittivity parameter is better than 5% throughout the frequency range. All tested samples have been compared with the two transmission-line technique results.

ACKNOWLEDGEMENT

In a particular way, the authors thank the Phéline Laboratory for its special multifaceted assistance and support to this work, also the anonymous reviewers for their attentive revision and thorough assessment.

Additional information

Notes on contributors

F. Moukanda Mbango

Franck Moukanda Mbango received an Engineering degree in microwave electronics from UMMTO (Algeria) in 2001, an MSc and PhD degrees in microwave circuits from INP and UJF, Grenoble (France) in 2003 and 2008, respectively. During 2009–2014, he was involved in many telecommunication industrial projects as an R&D engineer and research assistant consultant to ALTRAN Technologies for Vallourec and EMC Engineer to CSTB-Grenoble. He also worked as design engineer for FLORALIS UGA-FILIALE in 2020. He currently works as the African and Malagasy Council for Higher Education. Senior lecturer and researcher at UMNG (Congo) and part-time teacher at the Pan African University, Institute of Basic Sciences, Technology and Innovation (PAUSTI – Kenya). His research fields focus on high-frequency material measurement techniques, electromagnetic environment impact, electromagnetic modeling, and microwave system designs (antennas and circuits).

M. G. Lountala

Micke Ghislain Lountala received an MSc degree in electronics engineering at Université Marien Ngouabi, Congo Republic, in 2016. He has been teaching electronics at a trading school called Lycée Technique du 1er Mai. He is currently a PhD student in microwave electronics at the electrical and electronics engineering laboratory at a high national polytechnic school (ENSP). His field of research concerns the millimeter dielectric material characterization. E-mail: [email protected]

F. Ndagijimana

Fabien Ndagijimana is professor at Université Grenoble Alpes in Grenoble, France. He received his PhD, specializing in microwaves and optoelectronics, in 1990, at Institut National Polytechnique de Grenoble (INPG), France. Then, he joined the faculty of Electrical Engineering ENSERG as associate professor, where he lectured on microwave techniques and electromagnetic modeling. Since September 1997, he joined the Université Grenoble Alpes as a professor at the Institut Universitaire de Technologie (IUT). His research activities focus on the characterization and electromagnetic modeling of microwave devices for wireless applications, signal integrity in high-speed applications, and test tools for EM compatibility standards. E-mail: [email protected]

D. Lilonga-Boyenga

Désiré Lilonga-Boyenga received the Maîtrise and MSc degrees in physics in 1980 and 1981 at Université de Pau and Bordeaux (France), respectively. In 1984, he graduated with the 3rd cycle doctor degree and received the PhD degree in 2005 in electronics at the national polytechnic institute (INP), Toulouse, France. He is currently the African and Malagasy Council for Higher Education (CAMES) professor at Marien Ngouabi University. He is involved in the numerical modeling of the microwave structure discontinuities and their applications to filter and antenna designs and microwave material characterization. E-mail: [email protected]

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.