New approach to quality in a near-zero defect environment

Abstract

In today's manufacturing environment, product quality and process productivity have reached a level at which a new quality management philosophy would be useful to maintain an organization's competitive edge. New techniques are also needed as conventional statistical process management procedures would encounter difficulties in their application at this level. In this paper, a ‘do it better each time’ strategy is advanced to replace the ‘do it right the first time’ concept. Adaptation of statistical tools for quality monitoring and control in the light of the new philosophy in a near-zero defect environment is also discussed.