Ferroelectric Properties of PbZr_0.40Ti_0.60O₃/ La_xSr_1−xCoO₃ Heterostructures Prepared by Chemical Solution Routes

Abstract

PbZr_0.40Ti_0.60O₃/La _x Sr_{1 − x} CoO₃ (PZT/LSCO) heterostructures have been grown on Si-based substrates by chemical solution routes. X-ray diffraction analysis showed that PZT on LSCO are polycrystalline with (110) orientation and entirely perovskite phase. The resistance of LSCO is strongly affected by the ratio of La/Sr and the annealing atmosphere for the LSCO thin films. The ferroelectricity of PZT is strongly dependent on LSCO electrode, the P-E hystersis loops of PZT deposited on LSCO which annealed in air is more asymmetry than that annealed in oxygen. At the applied electric field of 300 kV/cm, all PZT films have the resisitivity larger than 10¹⁰ Ω · cm. The fatigue resistance is strongly affected by the resistance of the LSCO electrode. The ferroelctric properties are strongly improved by LSCO buffer layer between PZT and Pt bottom electrode.

Keywords:

• ferroelectricity
• PZT thin films
• LSCO films
• chemical solution routes

ACKNOWLEDGEMENTS

This work was supported by the Natural Science Foundation of China (No. 60223006).