Controlling the defect density to improve the output power of InGaN/GaN-based vertical light-emitting diodes by using substrates patterned with SiO₂ lenses

Abstract

In this study, we investigated the effect of SiO₂ lenses on the output power of InGaN/GaN-based vertical light-emitting diodes (VLEDs; wavelength = 445 nm) and compared the results to those of reference VLEDs without the SiO₂ lenses (planar samples). Arrays of SiO₂ lenses (pitch = 3 μm, width = 2.5 μm, height = 1.0 μm) were formed on c-plane sapphire substrates. The external quantum efficiency (EQE) of the packaged VLEDs with planar and patterned substrates was characterised. At 5 mA, the EQE of the patterned samples was 150% higher than that of the planar samples. A patterned, N-polar, n-GaN sample contained far fewer nanopipes (approximately 2.2 × 10⁵ cm⁻²) than a planar n-GaN sample (approximately 2.4 × 10⁶ cm⁻²). Furthermore, the patterned samples contained far fewer threading dislocations (approximately 1.0 × 10⁸ cm⁻²) than the planar samples (approximately 5.0 × 10⁸ cm⁻²). Scanning electron microscopy (SEM) images showed that the photoelectrochemical (PEC)-etched patterned samples contained cones that were 150% larger than that of the PEC-etched planar samples. In addition, SEM images, cathode luminescence measurements and finite-difference time-domain simulations were used to characterise the improved light output of the patterned samples.

Keywords:

• GaN
• light emitting diode
• line defects
• patterned substrate
• external quantum efficiency
• structural analysis