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Original Articles

The thermal oxidation of silicon the special case of the growth of very thin films

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Pages 237-274 | Received 15 Jul 1986, Published online: 28 Jul 2006

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Volker Presser & KlausG. Nickel. (2008) Silica on Silicon Carbide. Critical Reviews in Solid State and Materials Sciences 33:1, pages 1-99.
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PIETERL. J. GUNTER, J.W. (HANS) NIEMANTSVERDRIET, FABIOH. RIBEIRO & GABORA. SOMORJAI. (1997) Surface Science Approach to Modeling Supported Catalysts. Catalysis Reviews 39:1-2, pages 77-168.
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Takeo Hattori. (1995) Chemical Structures of the SiO2Si Interface. Critical Reviews in Solid State and Materials Sciences 20:4, pages 339-382.
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M.P. Murrell, C.J. Sofield & S. Sugden. (1991) Silicon transport during oxidation. Philosophical Magazine B 63:6, pages 1277-1287.
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F.M. Ross & W.M. Stobbs. (1991) A study of the initial stages of the oxidation of silicon using the Fresnel method. Philosophical Magazine A 63:1, pages 1-36.
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J. Robertson & M. I. Manning. (1989) Healing layer formation in Fe–Cr–Si ferritic steels. Materials Science and Technology 5:8, pages 741-753.
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N.F. Mott, S. Rigo, F. Rochet & A.M. Stoneham. (1989) Oxidation of silicon. Philosophical Magazine B 60:2, pages 189-212.
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F. Rochet, M. Froment, C. D'anterroches, H. Roulet & G. Dufour. (1989) Growth of epitaxial silica on vicinal Si(001) surfaces during thermal oxidation in O2 . Philosophical Magazine B 59:3, pages 339-363.
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EugeneA. Irene. (1988) Models for the oxidation of silicon. Critical Reviews in Solid State and Materials Sciences 14:2, pages 175-223.
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John Robertson. (1987) The growth mechanism of thin oxide films on Si. Philosophical Magazine B 55:6, pages 673-684.
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A.M. Stoneham, C.R. M. Grovenor & A. Cerezo. (1987) Oxidation and the structure of the silicon/oxide interface. Philosophical Magazine B 55:2, pages 201-210.
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Articles from other publishers (105)

Q. Pan, L. Li, S. Shaikhutdinov, Y. Fujimori, M. Hollerer, M. Sterrer & H.-J. Freund. (2018) Model systems in heterogeneous catalysis: towards the design and understanding of structure and electronic properties. Faraday Discussions 208, pages 307-323.
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Santosh KC, Roberto C. Longo, Robert M. Wallace & Kyeongjae Cho. (2015) Surface oxidation energetics and kinetics on MoS2 monolayer. Journal of Applied Physics 117:13.
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D. Lafatzis & K. Mergia. (2013) Oxidation behaviour of Si wafer substrates in air. Journal of Applied Physics 114:14.
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Jean‐Jacques Ganem & Isabelle Trimaille. 2013. Silicon Technologies. Silicon Technologies 1 101 .
Robert Hull, Abbas Ourmazd, W. D. Rau, P. Schwander, Martin L. Green & Raymond T. Tung. 2006. Materials Science and Technology. Materials Science and Technology.
O. V. Aleksandrov & A. I. Dus’. (2011) A model of formation of fixed charge in thermal silicon dioxide. Semiconductors 45:4, pages 467-473.
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Koichi Akimoto & Takashi Emoto. (2010) Quantitative strain analysis of surfaces and interfaces using extremely asymmetric x-ray diffraction. Journal of Physics: Condensed Matter 22:47, pages 473001.
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Wa Li Zhang, Sam Zhang, Ming Yang, Zhen Liu, ZhanHong Cen, Tupei Chen & Dongping Liu. (2010) Electroluminescence of as-sputtered silicon-rich SiOx films. Vacuum 84:8, pages 1043-1048.
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Wa Li Zhang, Sam Zhang, Ming Yang & Tu Pei Chen. (2010) Microstructure of Magnetron Sputtered Amorphous SiO x Films: Formation of Amorphous Si Core−Shell Nanoclusters . The Journal of Physical Chemistry C 114:6, pages 2414-2420.
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Takeo HATTORI & Kazuyuki HIROSE. (2010) Formation, Atomic Structures, and Physical Properties of Si-SiO2 SystemSi‐SiO2系の形成・構造・物性. Hyomen Kagaku 31:1, pages 30-34.
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J. Farjas & P. Roura. (2007) Oxidation of silicon: Further tests for the interfacial silicon emission model. Journal of Applied Physics 102:5.
Crossref
P. Roura & J. Farjas. (2006) Comment on “Dynamics of thermal growth of silicon oxide films on Si”. Physical Review B 74:12.
Crossref
Angelo Bongiorno & Alfredo Pasquarello. (2005) Atomic-scale modelling of kinetic processes occurring during silicon oxidation. Journal of Physics: Condensed Matter 17:21, pages S2051-S2063.
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M. Castro-Colin, W. Donner, S. C. Moss, Z. Islam, S. K. Sinha & R. Nemanich. (2005) Synchrotron x-ray studies of vitreous over Si(001). II. Crystalline contribution . Physical Review B 71:4.
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Angelo Bongiorno & Alfredo Pasquarello. (2004) Multiscale modeling of oxygen diffusion through the oxide during silicon oxidation. Physical Review B 70:19.
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Hiroshi Yamada. (2004) Correlation between density and oxidation temperature for pyrolytic-gas passivated ultrathin silicon oxide films. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 22:1, pages 82-87.
Crossref
Hiroshi Yamada. (2003) Density and nitrogen content of ultrathin silicon oxide gate films grown using in situ pyrolytic-gas passivation . Journal of Applied Physics 93:8, pages 4902-4908.
Crossref
A.L. Shluger, A.S. Foster, J.L. Gavartin & P.V. Sushko. 2003. Nano and Giga Challenges in Microelectronics. Nano and Giga Challenges in Microelectronics 151 222 .
Angelo Bongiorno & Alfredo Pasquarello. (2002) Energetics of oxygen species in crystalline and amorphous SiO2: a first-principles investigation. Solid-State Electronics 46:11, pages 1873-1878.
Crossref
Jean-Baptiste d’Espinose de la Caillerie, André Pierre Legrand & Youssef El Kortobi. 2002. Nanostructured Silicon-based Powders and Composites. Nanostructured Silicon-based Powders and Composites.
Hiroshi Yamada. (2002) Changes in the density of ultrathin silicon oxide films related to excess Si atoms near the oxide–Si(100) interface. Journal of Applied Physics 91:3, pages 1108-1112.
Crossref
C. Krug & I.J.R. Baumvol. 2002. Non-Crystalline Films for Device Structures. Non-Crystalline Films for Device Structures 1 133 .
C. Krag & I.J.R. Baumvol. 2002. Handbook of Thin Films. Handbook of Thin Films 169 229 .
Angelo Bongiorno & Alfredo Pasquarello. (2001) Oxygen species in SiO2: a first-principles investigation. Microelectronic Engineering 59:1-4, pages 167-172.
Crossref
Laurent Favaro. (2001) Rotations of silica tetrahedrons in first oxide layer on Si(100): A quantum chemical study. Computational Materials Science 21:4, pages 488-495.
Crossref
M.A Szymanski, A.M Stoneham & A Shluger. (2001) The different roles of charged and neutral atomic and molecular oxidising species in silicon oxidation from ab initio calculations. Solid-State Electronics 45:8, pages 1233-1240.
Crossref
Hiroshi Yamada. (2001) Correlation between excess Si atoms near the ultrathin silicon oxide-Si(100) interface and oxidation temperature. Journal of Electronic Materials 30:8, pages 1021-1027.
Crossref
A. Marshall Stoneham, Marek A. Szymanski & Alexander L. Shluger. (2001) Atomic and ionic processes of silicon oxidation. Physical Review B 63:24.
Crossref
Hiroshi Yamada. (2001) Microscopic composition difference related to oxidizing humidity near the ultrathin silicon oxide–Si(100) interface. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 19:2, pages 627-632.
Crossref
Daniel Bauza. 2001. Handbook of Surfaces and Interfaces of Materials. Handbook of Surfaces and Interfaces of Materials 115 216 .
A. Pasquarello, M. S. Hybertsen & R. Car. 2001. Fundamental Aspects of Silicon Oxidation. Fundamental Aspects of Silicon Oxidation 107 125 .
F. M. Ross & J. M. Gibson. 2001. Fundamental Aspects of Silicon Oxidation. Fundamental Aspects of Silicon Oxidation 35 60 .
Leonard C. Feldman. 2001. Fundamental Aspects of Silicon Oxidation. Fundamental Aspects of Silicon Oxidation 1 11 .
R. Hull, A. Ourmazd, W. D. Rau, P. Schwander, M. L. Green & R. T. Tung. 2000. Handbook of Semiconductor Technology Set. Handbook of Semiconductor Technology Set 453 540 .
R. Hull, A. Ourmazd, W. D. Rau, P. Schwander, M. L. Green & R. T. Tung. 2000. Handbook of Semiconductor Technology. Handbook of Semiconductor Technology 453 540 .
R. M. C. de Almeida, S. Gonçalves, I. J. R. Baumvol & F. C. Stedile. (2000) Dynamics of thermal growth of silicon oxide films on Si. Physical Review B 61:19, pages 12992-12999.
Crossref
I.C. Vickridge, J.-J. Ganem, G. Battistig & E. Szilagyi. (2000) Oxygen isotopic tracing study of the dry thermal oxidation of 6H SiC. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 161-163, pages 462-466.
Crossref
H. C. Lu, E. P. Gusev, E. Garfunkel, B. W. Busch, T. Gustafsson, T. W. Sorsch & M. L. Green. (2000) Isotopic labeling studies of interactions of nitric oxide and nitrous oxide with ultrathin oxynitride layers on silicon. Journal of Applied Physics 87:3, pages 1550-1555.
Crossref
J.Z. He, J.B. Xu, M.S. Xu, J. Xu, C.H. Ng & I.H. Wilson. (2000) Direct observation of ordered structures during oxidation of Si(111). Direct observation of ordered structures during oxidation of Si(111).
Hiroshi Yamada. (1999) Density difference related to humidity during dry oxidation for ultrathin silicon oxide films. Journal of Applied Physics 86:11, pages 5968-5974.
Crossref
I.J.R. Baumvol. (1999) Atomic transport during growth of ultrathin dielectrics on silicon. Surface Science Reports 36:1-8, pages 1-166.
Crossref
Alfredo Pasquarello. (1999) Network transformation processes during oxidation of silicon. Microelectronic Engineering 48:1-4, pages 89-94.
Crossref
Marcus Bäumer & Hans-Joachim Freund. (1999) Metal deposits on well-ordered oxide films. Progress in Surface Science 61:7-8, pages 127-198.
Crossref
I. J. R. Baumvol, C. Krug, F. C. Stedile, F. Gorris & W. H. Schulte. (1999) Isotopic substitution of Si during thermal growth of ultrathin silicon-oxide films on Si(111) in . Physical Review B 60:3, pages 1492-1495.
Crossref
Hiroshi Yamada. (1999) Correlation between reliability and oxidation temperature for ultra-dry ultrathin silicon oxide films. Journal of Electronic Materials 28:4, pages 377-384.
Crossref
Alfredo Pasquarello, Mark S. Hybertsen & Roberto Car. (1998) Interface structure between silicon and its oxide by first-principles molecular dynamics. Nature 396:6706, pages 58-60.
Crossref
Eli Ruckenstein & Yun Hang Hu. (1998) Reaction between Silane and the Lattice Oxygen of Transition Metal Oxides. Langmuir 14:20, pages 5845-5849.
Crossref
Dinesh Chopra & Ian Ivar Suni. (1998) In situ measurements of ultrathin silicon oxide dissolution rates. Thin Solid Films 323:1-2, pages 170-173.
Crossref
Claude R. Henry. (1998) Surface studies of supported model catalysts. Surface Science Reports 31:7-8, pages 231-325.
Crossref
E. Garfunkel, E. P. Gusev, H. C. Lu, T. Gustafsson & M. L. Green. 1998. Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices. Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices 39 48 .
L C Feldman, E. P. Gusev & E. Garfunkel. 1998. Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices. Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices 1 24 .
Hiroshi Yamada. (1997) Density of ultradry ultrathin silicon oxide films and its correlation with reliability. Journal of Applied Physics 82:10, pages 4916-4922.
Crossref
Koichi. Akimoto, Takashi Emoto & Ayahiko Ichimiya. (2011) Surface and Interface Strains Studied by X-Ray Diffraction. MRS Proceedings 505.
Crossref
M. Dinescu, N. Chitica, C. Stanciu, G. Dinescu, C. Ghica, D. Ghica, A. Ferrari, M. Balucani, G. Maiello, S.La Monica & G. Masini. 1997. Physics and Applications of Non-Crystalline Semiconductors in Optoelectronics. Physics and Applications of Non-Crystalline Semiconductors in Optoelectronics 445 450 .
I. N. Mihailescu, Adriana Lita, V. S. Teodorescu, A. Luches, M. Martino, A. Perrone & Maria Gartner. (1996) Pulsed laser deposition of silicon nitride thin films by laser ablation of a Si target in low pressure ammonia. Journal of Materials Science 31:11, pages 2839-2847.
Crossref
G. Leggieri, A. Luches, M. Martino, A. Perrone, R. Alexandrescu, A. Barborica, E. Gyorgy, I.N. Mihailescu, G. Majni & P. Mengucci. (1996) Laser reactive ablation deposition of silicon carbide films. Applied Surface Science 96-98, pages 866-869.
Crossref
G. De Cesare, S. La Monica, G. Maiello, E. Proverbio, A. Ferrari, M. Dinescu, N. Chitica, I. Morjan & A. Andrei. (1996) Crystallization of amorphous silicon carbide thin films by laser treatment. Surface and Coatings Technology 80:1-2, pages 237-241.
Crossref
G. Leggieri, A. Luches, M. Martino, A. Perrone, R. Alexandrescu, A. Barborica, E. Gyorgy, I.N. Mihailescu, G. Majni & P. Mengucci. 1996. Laser Ablation. Laser Ablation 866 869 .
A. Munkholm, S. Brennan, F. Comin & L. Ortega. (1995) Observation of a Distributed Epitaxial Oxide in Thermally Grown Si on Si(001) . Physical Review Letters 75:23, pages 4254-4257.
Crossref
E. P. Gusev, H. C. Lu, T. Gustafsson & E. Garfunkel. (1995) Growth mechanism of thin silicon oxide films on Si(100) studied by medium-energy ion scattering. Physical Review B 52:3, pages 1759-1775.
Crossref
R.K Chanana, H.N Upadhyay, R Dwivedi & S.K Srivastava. (1995) Electrical properties of 6.3 nm RF oxygen plasma oxide grown near room temperature with in situ dry cleaning of Si surface. Solid-State Electronics 38:5, pages 1075-1080.
Crossref
C J Sofield & A M Stoneham. (1995) Oxidation of silicon: the VLSI gate dielectric. Semiconductor Science and Technology 10:3, pages 215-244.
Crossref
Frances M. Ross, J.Murray Gibson & Ray D. Twesten. (1994) Dynamic observations of interface motion during the oxidation of silicon. Surface Science 310:1-3, pages 243-266.
Crossref
F.C. Stedile, I.J.R. Baumvol, J.-J. Ganem, S. Rigo, I. Trimaille, G. Battistig, W.H. Schulte & H.W. Becker. (1994) IBA study of the growth mechanisms of very thin silicon oxide films: the effect of wafer cleaning. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 85:1-4, pages 248-254.
Crossref
V. D. Borman, E. P. Gusev, Yu. Yu. Lebedinski & V. I. Troyan. (1994) Mechanism of submonolayer oxide formation on silicon surfaces upon thermal oxidation. Physical Review B 49:8, pages 5415-5423.
Crossref
J.-J. Ganem, G. Battistig, S. Rigo & I. Trimaille. (1993) A study of the initial stages of the oxidation of silicon using 18O2 and RTP. Applied Surface Science 65-66, pages 647-653.
Crossref
E.P. Gusev, H.C. Lu, T. Gustafsson & E. Garfunkel. (2011) On the Mechanism of Ultra Thin Silicon Oxide Film Growth During Thermal Oxidation. MRS Proceedings 318.
Crossref
F. J. Himpsel, D. A. Lapiano-Smith, J. F. Morar & J. Bevk. 1993. The Physics and Chemistry of SiO2 and the Si-SiO2 Interface 2. The Physics and Chemistry of SiO2 and the Si-SiO2 Interface 2 237 245 .
Wolfgang Losch. (1992) A model of low temperature silicon compound material growth kinetics. Thin Solid Films 216:2, pages 225-229.
Crossref
A. Gheorghiu, C. Sénémaud, H. Roulet, G. Dufour, T. Moreno, S. Bodeur, C. Reynaud, M. Cauchetier & M. Luce. (1992) Atomic configurations and local order in laser-synthesized Si, Si-N, Si-C, and Si-C-N nanometric powders, as studied by x-ray-induced photoelectron spectroscopy and extended x-ray-absorption fine-structure analysis. Journal of Applied Physics 71:9, pages 4118-4127.
Crossref
S. Sugden, C.J. Sofield & M.P. Murrell. (1992) Sputtering by MeV ions. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 67:1-4, pages 569-573.
Crossref
H.J. Lewerenz. (1992) Anodic oxides on silicon. Electrochimica Acta 37:5, pages 847-864.
Crossref
J-J. Ganem, S. Rigo, I. Trimaille, G-N. Lu, G. Dufour & H. Roulet. (1992) NRA and XPS characterizations of layers formed by rapid thermal nitridation of thin SiO2 films. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 64:1-4, pages 744-749.
Crossref
S. Rigo. (1992) Nuclear microanalysis study of the growth of thin dielectric films on silicon by classical and rapid thermal treatments. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 64:1-4, pages 1-11.
Crossref
Hisashi Fukuda, Makoto Yasuda, Toshiyuki Iwabuchi & Seigo Ohno. (1992) Characterization of SiO2/Si(100) interface structure of N2O-oxynitrided ultrathin SiO2 films. Applied Surface Science 60-61, pages 359-366.
Crossref
Takeo Hattori. (1991) Chemical structure of ultrathin silicon oxide films and the oxide-silicon interface. Thin Solid Films 206:1-2, pages 1-5.
Crossref
S. L. Chan & S. R. Elliott. (1991) Theoretical study of the interstice statistics of the oxygen sublattice in vitreous . Physical Review B 43:5, pages 4423-4432.
Crossref
S. C. Woronick, W. Ng, A. Król, Y. H. Kao & E. Arnold. (1991) Characterization of SiO2/Si heterostructures by soft x-ray reflection. Journal of Applied Physics 69:3, pages 1631-1642.
Crossref
L Brugemann, R Bloch, W Press & P Gerlach. (1990) Surface and interface topography of amorphous SiO 2 /crystalline Si(100) studied by X-ray diffraction . Journal of Physics: Condensed Matter 2:45, pages 8869-8879.
Crossref
K. Taniguchi, Y. Shibata & C. Hamaguchi. (1990) Process modeling and simulation: boundary conditions for point defect-based impurity diffusion model. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 9:11, pages 1177-1183.
Crossref
J.M.M. De Nijs & A. Van Silfhout. (1990) The Ti/c-Si solid state reaction. Applied Surface Science 40:4, pages 349-358.
Crossref
Akira Sakai, Toru Tatsumi, Taeko Niino, Hiroyuki Hirayama & Koichi Ishida. (1989) Interface atomic structure of Si/SiO2/Si formed by molecular beam deposition. Applied Physics Letters 55:24, pages 2500-2502.
Crossref
F. Lutz, J. L. Bischoff, L. Kubler & D. Bolmont. (1989) Substrate temperature dependence of the initial growth mode of on Si(100)-(2×1) exposed to : A photoemission study . Physical Review B 40:15, pages 10356-10361.
Crossref
I. Trimaille & S. Rigo. (1989) Use of 18O isotopic labelling to study thermal dry oxidation of silicon as a function of temperature and pressure. Applied Surface Science 39:1-4, pages 65-80.
Crossref
T. Bekkay, E. Sacher & A. Yelon. (1989) Surface reaction during the argon ion sputter cleaning of surface oxidized crystalline silicon (111). Surface Science Letters 217:1-2, pages L377-L381.
Crossref
T. Bekkay, E. Sacher & A. Yelon. (1989) Surface reaction during the argon ion sputter cleaning of surface oxidized crystalline silicon (111). Surface Science 217:1-2, pages L377-L381.
Crossref
A. M. Stoneham. 1988. Materials Modification by High-fluence Ion Beams. Materials Modification by High-fluence Ion Beams 217 230 .
F. J. Himpsel, F. R. McFeely, A. Taleb-Ibrahimi, J. A. Yarmoff & G. Hollinger. (1988) Microscopic structure of the /Si interface . Physical Review B 38:9, pages 6084-6096.
Crossref
H. Wong & Y. C. Cheng. (1988) A new growth model of thin silicon oxide in dry oxygen. Journal of Applied Physics 64:2, pages 893-897.
Crossref
F. M. Ross & W. M. Stobbs. (2004) Interface analysis using elastic scattering in the transmission electron microscope: Application to the oxidation of silicon. Surface and Interface Analysis 12:1, pages 35-44.
Crossref
F. G. Bell & L. Ley. (1988) Photoemission study of (0≤x≤2) alloys . Physical Review B 37:14, pages 8383-8393.
Crossref
G. Hollinger, S. J. Sferco & M. Lannoo. (1988) Deviation from the classical 4:2 coordination in very thin films grown on silicon . Physical Review B 37:12, pages 7149-7152.
Crossref
F. Rochet, G. Dufour, H. Roulet, B. Pelloie, J. Perrière, E. Fogarassy, A. Slaoui & M. Froment. (1988) Modification of SiO through room-temperature plasma treatments, rapid thermal annealings, and laser irradiation in a nonoxidizing atmosphere. Physical Review B 37:11, pages 6468-6477.
Crossref
P. H. Fuoss, L. J. Norton, S. Brennan & A. Fischer-Colbrie. (1988) X-ray scattering studies of the Si- interface . Physical Review Letters 60:7, pages 600-603.
Crossref
Tadahiro Ohmi, Mizuho Morita & Takeo Hattori. 1988. The Physics and Chemistry of SiO2 and the Si-SiO2 Interface. The Physics and Chemistry of SiO2 and the Si-SiO2 Interface 413 419 .
G. Hollinger, R. Saoudi, P. Ferret & M. Pitaval. 1988. The Physics and Chemistry of SiO2 and the Si-SiO2 Interface. The Physics and Chemistry of SiO2 and the Si-SiO2 Interface 211 218 .
A. Ourmazd & J. Bevk. 1988. The Physics and Chemistry of SiO2 and the Si-SiO2 Interface. The Physics and Chemistry of SiO2 and the Si-SiO2 Interface 189 198 .
F.G. Bell & L. Ley. (1987) Photoemission in SiOx alloys. Journal of Non-Crystalline Solids 97-98, pages 1007-1010.
Crossref
Eva M. Oellig, E. G. Michel, M. C. Asensio & R. Miranda. (1987) Ultrathin gate oxides formed by catalytic oxidation of silicon. Applied Physics Letters 50:23, pages 1660-1662.
Crossref
Ian W. Boyd. (2011) Photo-Oxidation of Silicon: Reaction Mechanisms and Film Structure. MRS Proceedings 105.
Crossref
A. Ourmazd & J. Bevk. (2011) The Structure of the (001)Si/SiO 2 Interface . MRS Proceedings 105.
Crossref

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