Citations (36)
Keep up to date with the latest research on this topic with citation updates for this article.
Read on this site (1)
W. Sigle. (1993) Structure refinement of quasicrystalline Al62Cu20Co15Si3 by electron channelling. Philosophical Magazine Letters 68:1, pages 39-43.
Read now
Read now
Articles from other publishers (35)
Partha Pratim Das, Giulio Guzzinati, Catalina Coll, Alejandro Gomez Perez, Stavros Nicolopoulos, Sonia Estrade, Francesca Peiro, Johan Verbeeck, Aikaterini A. Zompra & Athanassios S. Galanis. (2020) Reliable Characterization of Organic & Pharmaceutical Compounds with High Resolution Monochromated EEL Spectroscopy. Polymers 12:7, pages 1434.
Crossref
Crossref
Gianluigi Botton & Sagar Prabhudev. 2019. Springer Handbook of Microscopy. Springer Handbook of Microscopy
345
453
.
NICOLAS BRODUSCH & RAYNALD GAUVIN. (2017) The qualitative f-ratio method applied to electron channelling-induced x-ray imaging with an annular silicon drift detector in a scanning electron microscope in the transmission mode. Journal of Microscopy 267:3, pages 288-298.
Crossref
Crossref
Paul Thomas & Paul Midgley. 2016. Transmission Electron Microscopy. Transmission Electron Microscopy
377
404
.
Koji Kimoto, Kazuo Ishizuka & Yoshio Matsui. (2008) Decisive factors for realizing atomic-column resolution using STEM and EELS. Micron 39:6, pages 653-657.
Crossref
Crossref
Koji Kimoto, Kazuo Ishizuka & Yoshio Matsui. (2008) Decisive factors for realizing atomic-column resolution using STEM and EELS. Micron 39:3, pages 257-262.
Crossref
Crossref
M. Watanabe, D.W. Ackland, A. Burrows, C.J. Kiely, D.B. Williams, O.L. Krivanek, N. Dellby, M.F. Murfitt & Z. Szilagyi. (2006) Improvements in the X-Ray Analytical Capabilities of a Scanning Transmission Electron Microscope by Spherical-Aberration Correction. Microscopy and Microanalysis 12:6, pages 515-526.
Crossref
Crossref
Se Ahn Song, Tatsumi Hirano, Jong Bong Park, Kazutoshi Kaji, Ki Hong Kim & Shohei Terada. (2005) Searching Ultimate Nanometrology for AlOx Thickness in Magnetic
Tunnel Junction by Analytical Electron Microscopy and X-ray
Reflectometry. Microscopy and Microanalysis 11:5, pages 431-445.
Crossref
Crossref
Werner Grogger, Maria Varela, Roger Ristau, Bernhard Schaffer, Ferdinand Hofer & Kannan M. Krishnan. (2005) Energy-filtering transmission electron microscopy on the nanometer length scale. Journal of Electron Spectroscopy and Related Phenomena 143:2-3, pages 139-147.
Crossref
Crossref
Masanori Mitome, Yoshio Bando, Dmitri Golberg, Keiji Kurashima, Yoshihiro Okura, Toshikatsu Kaneyama, Mikio Naruse & Yoshiaki Honda. (2004) Nanoanalysis by a high‐resolution energy filtering transmission electron microscope. Microscopy Research and Technique 63:3, pages 140-148.
Crossref
Crossref
Werner Grogger, Bernhard Schaffer, Kannan M. Krishnan & Ferdinand Hofer. (2003) Energy-filtering TEM at high magnification: spatial resolution and detection limits. Ultramicroscopy 96:3-4, pages 481-489.
Crossref
Crossref
S.J. Pennycook. 2002. Characterization of Materials. Characterization of Materials.
K. Leifer, P.A. Buffat, P.A. Stadelmann & E. Kapon. (2000) Theoretical and experimental limits of the analysis of III/V semiconductors using EELS. Micron 31:4, pages 411-427.
Crossref
Crossref
G. Kothleitner & F. Hofer. (1998) Optimization of the Signal to Noise Ratio in EFTEM Elemental Maps with Regard to Different Ionization Edge Types. Micron 29:5, pages 349-357.
Crossref
Crossref
M. K. H. Natusch, G. A. Botton, R. F. Broom, P. D. Brown, D. M. Tricker & C. J. Humphreys. (2011) Local Electronic Structure Of Defects In Gan From Spatially Resolved Electron Energy-Loss Spectroscopy. MRS Proceedings 482.
Crossref
Crossref
Stephen J. Pennycook, David E. Jesson, Nigel D. Browning & Matthew F. Chisholm. 1996. Microbeam and Nanobeam Analysis. Microbeam and Nanobeam Analysis
195
207
.
O. L. KRIVANEK, M. K. KUNDMANN & K. KIMOTO. (1995) Spatial resolution in EFTEM elemental maps. Journal of Microscopy 180:3, pages 277-287.
Crossref
Crossref
N. D. BROWNING & S. J. PENNYCOOK. (1995) Atomic-resolution electron energy-loss spectroscopy in the scanning transmission electron microscope. Journal of Microscopy 180:3, pages 230-237.
Crossref
Crossref
P.A. Midgley, M. Saunders, R. Vincent & J.W. Steeds. (1995) Energy-filtered convergent-beam diffraction: examples and future prospects. Ultramicroscopy 59:1-4, pages 1-13.
Crossref
Crossref
S.J. Pennycook, D.E. Jesson & N.D. Browning. (1995) Atomic-resolution electron energy loss spectroscopy in crystalline solids. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 96:3-4, pages 575-582.
Crossref
Crossref
Hiroki Kurata, Seiji Isoda & Takashi Kobayashi. (1995) Quantitative Elemental Distribution Image of a Carbon Nanotube. Microscopy Microanalysis Microstructures 6:4, pages 405-413.
Crossref
Crossref
M. M. McGibbon, N. D. Browning, M. F. Chisholm, A. J. McGibbon, S. J. Pennycook, V. Ravikumar & V. P. Dravid. (2011) Atomic Scale Structure and Chemistry of Interfaces by Z-Contrast Imaging and Electron Energy Loss Spectroscopy in the Stem. MRS Proceedings 341.
Crossref
Crossref
N. D. Browning, M. F. Chisholm & S. J. Pennycook. (1993) Atomic-resolution chemical analysis using a scanning transmission electron microscope. Nature 366:6451, pages 143-146.
Crossref
Crossref
M.M. Mcgibbon, N.D. Browning, M.F. Chisholm, S.J. Pennycook, V. Ravikumar & V.P. Dravid. (2011) Atomic Scale Structure and Chemistry of Interfaces by Z-Contrast Imaging and Electron Energy Loss Spectroscopy in the Stem. MRS Proceedings 319.
Crossref
Crossref
W. Qian, B. Tötdal, R. Hoier & J.C.H. Spence. (1992) Channelling effects on oxygen-characteristic X-ray emission and their use as reference sites for ALCHEMI. Ultramicroscopy 41:1-3, pages 147-151.
Crossref
Crossref
Nigel D. Browning & Stephen J. Pennycook. (2011) Application of Z-Contrast Imaging to Obtain Column-by-Column Spectroscopic Analysis of Materials. MRS Proceedings 295.
Crossref
Crossref
David J. Smith. (2005) Achievement of atomic resolution electron microscopy. Journal of Electron Microscopy Technique 12:1, pages 11-23.
Crossref
Crossref
S.J. Pennycook. (1988) Delocalization corrections for electron channeling analysis. Ultramicroscopy 26:1-2, pages 239-248.
Crossref
Crossref
D. Imeson. (2011) Studies of supported metal catalysts using high resolution secondary electron imaging in a STEM. Journal of Microscopy 147:1, pages 65-74.
Crossref
Crossref
S.D. Berger, D. Imeson & R.H. Milne. (1987) Experimental determination of the probe profile in a dedicated scanning transmission electron microscope. Ultramicroscopy 21:3, pages 293-296.
Crossref
Crossref
S. J. Pennycook, S. D. Berger & R. J. Culbertson. (1986) Elemental mapping with elastically scattered electrons. Journal of Microscopy 144:3, pages 229-249.
Crossref
Crossref
S. J. Pennycook & J. Narayan. (1985) Atom Location by Axial-Electron-Channeling Analysis. Physical Review Letters 54:14, pages 1543-1546.
Crossref
Crossref
A van Oostrom. (1984) Characterization of semiconductor materials and devices by surface analysis techniques. Vacuum 34:10-11, pages 881-892.
Crossref
Crossref
S. J. Pennycook & J. Narayan. (1984) Direct imaging of dopant distributions in silicon by scanning transmission electron microscopy. Applied Physics Letters 45:4, pages 385-387.
Crossref
Crossref
S.J. Pennycook, A. Howie, M.D. Shannon & R. Whyman. (1983) Characterization of supported catalysts by high-resolution stem. Journal of Molecular Catalysis 20:3, pages 345-355.
Crossref
Crossref