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Original Articles

Capacity-constrained scheduling for a logic IC final test facility

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Pages 79-99 | Published online: 21 Feb 2007

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Read on this site (8)

James C. Chen, Cheng-Ju Sun & Tzu-Li Chen. (2015) Capacity planning for integrated circuit final test plants. International Journal of Computer Integrated Manufacturing 28:12, pages 1262-1274.
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K-C Ying & S-W Lin. (2014) Efficient wafer sorting scheduling using a hybrid artificial immune system. Journal of the Operational Research Society 65:2, pages 169-179.
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Kuo-Ching Ying. (2012) Scheduling identical wafer sorting parallel machines with sequence-dependent setup times using an iterated greedy heuristic. International Journal of Production Research 50:10, pages 2710-2719.
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Y.T. Tai, W.L. Pearn & J.H. Lee. (2012) Cycle time estimation for semiconductor final testing processes with Weibull-distributed waiting time. International Journal of Production Research 50:2, pages 581-592.
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Lin Danping & Carman K.M. Lee. (2011) A review of the research methodology for the re-entrant scheduling problem. International Journal of Production Research 49:8, pages 2221-2242.
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Shih-Wei Lin, Zne-Jung Lee, Kuo-Ching Ying & Rong-Ho Lin. (2011) Meta-heuristic algorithms for wafer sorting scheduling problems. Journal of the Operational Research Society 62:1, pages 165-174.
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G. Celano, A. Costa & S. Fichera. (2008) Scheduling of unrelated parallel manufacturing cells with limited human resources. International Journal of Production Research 46:2, pages 405-427.
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R. Al-Aomar. (2006) Capacity-constrained production scheduling of multiple vehicle programs in an automotive pilot plant. International Journal of Production Research 44:13, pages 2573-2604.
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Articles from other publishers (21)

Weiguo Hu, Min Liu, Mingyu Dong, Tao Liu, Yabin Zhang & Guanyi Cheng. (2023) A greedy-based crow search algorithm for semiconductor final testing scheduling problem. Computers & Industrial Engineering, pages 109423.
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Dominik Kress & David Müller. (2022) Semiconductor final-test scheduling under setup operator constraints. Computers & Operations Research 138, pages 105619.
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Jian Lin, Yang-Yuan Li & Hong-Bo Song. (2022) Semiconductor final testing scheduling using Q-learning based hyper-heuristic. Expert Systems with Applications 187, pages 115978.
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Hyun Joong Yoon & Junjae Chae. (2019) Simulation Study for Semiconductor Manufacturing System: Dispatching Policies for a Wafer Test Facility. Sustainability 11:4, pages 1119.
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Liam Y. Hsieh & Chi-Bin Cheng. (2018) Efficient Due-Date Quoting and Production Scheduling for Integrated Circuit Packaging With Reentrant Processes. IEEE Transactions on Components, Packaging and Manufacturing Technology 8:8, pages 1487-1495.
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Yige Zhang, Yuangen Lu & Cangrong Zhang. (2018) Resource-reconfigured flow shop scheduling and lot-sizing problems in semiconductor test. Resource-reconfigured flow shop scheduling and lot-sizing problems in semiconductor test.
Yuanxing Pan, Hailong Liao, Junhui Li, Xiaohe Liu & Wenhui Zhu. (2018) Improved Image Processing Algorithms for Microprobe Final Test. IEEE Transactions on Components, Packaging and Manufacturing Technology 8:3, pages 499-505.
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Hong-Yan Sang, Pei-Yong Duan & Jun-Qing Li. (2018) An effective invasive weed optimization algorithm for scheduling semiconductor final testing problem. Swarm and Evolutionary Computation 38, pages 42-53.
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Qin Yang, Ju Liu, Yiping Huang, Yushi Wang & Tingting Wang. (2015) The dynamic 4S auto maintenance shop scheduling in a multi-constraint machine environment based on the theory of constraints. The International Journal of Advanced Manufacturing Technology 83:9-12, pages 1773-1785.
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Shengyao Wang, Ling Wang, Min Liu & Ye Xu. (2013) A hybrid estimation of distribution algorithm for the semiconductor final testing scheduling problem. Journal of Intelligent Manufacturing 26:5, pages 861-871.
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Shengyao Wang & Ling Wang. (2015) A knowledge-based multi-agent evolutionary algorithm for semiconductor final testing scheduling problem. Knowledge-Based Systems 84, pages 1-9.
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Shengyao Wang & Ling Wang. (2014) Compact estimation of distribution algorithm for semiconductor final testing scheduling problem. Compact estimation of distribution algorithm for semiconductor final testing scheduling problem.
Xiao-long Zheng, Ling Wang & Sheng-yao Wang. (2014) A novel fruit fly optimization algorithm for the semiconductor final testing scheduling problem. Knowledge-Based Systems 57, pages 95-103.
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Jei-Zheng Wu, Xin-Chang Hao, Chen-Fu Chien & Mitsuo Gen. (2011) A novel bi-vector encoding genetic algorithm for the simultaneous multiple resources scheduling problem. Journal of Intelligent Manufacturing 23:6, pages 2255-2270.
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Zhicong Zhang, Li Zheng, Forest Hou & Na Li. (2011) Semiconductor final test scheduling with Sarsa(λ,k) algorithm. European Journal of Operational Research 215:2, pages 446-458.
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Zhicong Zhang. (2010) Reinforcement learning based scheduling in semiconductor final testing. Reinforcement learning based scheduling in semiconductor final testing.
Wu-Der Jeng & Meng-Shiun Tsai. (2010) Scheduling semiconductor final testing a DBR based simulation model. Scheduling semiconductor final testing a DBR based simulation model.
Giovanni Celano, Antonio Costa & Sergio Fichera. (2009) Constrained scheduling of the inspection activities on semiconductor wafers grouped in families with sequence-dependent set-up times. The International Journal of Advanced Manufacturing Technology 46:5-8, pages 695-705.
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C.Y. Huang. (2008) Mathematical Modeling of the IC Final Testing Order Selection Problem. Information Technology Journal 7:6, pages 918-923.
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Yang Song, Mike Tao Zhang, Jingang Yi, Lawrence Zhang & Li Zheng. (2007) Bottleneck Station Scheduling in Semiconductor Assembly and Test Manufacturing Using Ant Colony Optimization. IEEE Transactions on Automation Science and Engineering 4:4, pages 569-578.
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Mike Tao Zhang, Sophia Niu, Shiming Deng, Zhicong Zhang, Qi Li & Li Zheng. (2007) Hierarchical Capacity Planning With Reconfigurable Kits in Global Semiconductor Assembly and Test Manufacturing. IEEE Transactions on Automation Science and Engineering 4:4, pages 543-552.
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