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(conference) IFAC MIM
Few-shot learning for defect detection in manufacturing
Patrik Zajeca Jožef Stefan International Postgraduate School, Ljubljana, Slovenia;b Jožef Stefan Institute, Ljubljana, Slovenia
https://orcid.org/0000-0002-6630-3106View further author information
https://orcid.org/0000-0002-6630-3106View further author information, Jože M. Rožaneca Jožef Stefan International Postgraduate School, Ljubljana, Slovenia;b Jožef Stefan Institute, Ljubljana, Slovenia;c Qlector d.o.o., Ljubljana, SloveniaCorrespondence[email protected]
https://orcid.org/0000-0002-3665-639XView further author information
https://orcid.org/0000-0002-3665-639XView further author information, , , , Blaž Fortunab Jožef Stefan Institute, Ljubljana, Slovenia;c Qlector d.o.o., Ljubljana, Sloveniahttps://orcid.org/0000-0002-8585-9388View further author information
https://orcid.org/0000-0002-8585-9388View further author information & Dunja Mladenićb Jožef Stefan Institute, Ljubljana, Sloveniahttps://orcid.org/0000-0002-0360-6505View further author information
https://orcid.org/0000-0002-0360-6505View further author information show all