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(conference) IFAC MIM
Few-shot learning for defect detection in manufacturing
Patrik Zajeca Jožef Stefan International Postgraduate School, Ljubljana, Slovenia;b Jožef Stefan Institute, Ljubljana, Slovenia
https://orcid.org/0000-0002-6630-3106View further author information
Jože M. Rožaneca Jožef Stefan International Postgraduate School, Ljubljana, Slovenia;b Jožef Stefan Institute, Ljubljana, Slovenia;c Qlector d.o.o., Ljubljana, SloveniaCorrespondence[email protected]
https://orcid.org/0000-0002-3665-639XView further author information
Spyros Theodoropoulosd Department of Digital Systems, University of Piraeus, Piraeus, Greece;e Department of Electrical and Computer Engineering, National Technical University of Athens, Athens, GreeceView further author information
, Mihail Fontulf Iber-Oleff S.A., Coimbra, PortugalView further author information
, Erik Koehorstg Philips Consumer Lifestyle BV, Drachten, The NetherlandsView further author information
, Blaž Fortunab Jožef Stefan Institute, Ljubljana, Slovenia;c Qlector d.o.o., Ljubljana, Slovenia
https://orcid.org/0000-0002-8585-9388View further author information
Dunja Mladenićb Jožef Stefan Institute, Ljubljana, Slovenia
https://orcid.org/0000-0002-0360-6505View further author information
Received 20 Feb 2023, Accepted 22 Jan 2024, Published online: 27 Feb 2024
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