Citations (12)
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Read on this site (6)
Michael Bendersky, Noam Barak & Yisrael Parmet. (2022) Dual response surface optimization using a process “capability” index. Communications in Statistics - Theory and Methods 51:20, pages 7006-7020.
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Yu Zhu, Peng Zeng & Kristofer Jennings. (2007) Optimal Compound Orthogonal Arrays and Single Arrays for Robust Parameter Design Experiments. Technometrics 49:4, pages 440-453.
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VijayanN. Nair, Bovas Abraham, Jock MacKay, George Box, RaghuN. Kacker, ThomasJ. Lorenzen, JamesM. Lucas, RaymondH. Myers, G.
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RaymondH. Myers, AndreI. Khuri & Geoffrey Vining. (1992) Response Surface Alternatives to the Taguchi Robust Parameter Design Approach. The American Statistician 46:2, pages 131-139.
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William J. Welch, Tat-Kwan Yu, Sung Mo Kang & Jerome Sacks. (1990) Computer Experiments for Quality Control by Parameter Design. Journal of Quality Technology 22:1, pages 15-22.
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Articles from other publishers (6)
Yu Zhu. 2014. Wiley StatsRef: Statistics Reference Online. Wiley StatsRef: Statistics Reference Online.
Yu Zhu. 2007. Encyclopedia of Statistics in Quality and Reliability. Encyclopedia of Statistics in Quality and Reliability.
Tormod Næs, Ellen Mosleth Færgestad & John Cornell. (1998) A comparison of methods for analyzing data from a three component mixture experiment in the presence of variation created by two process variables. Chemometrics and Intelligent Laboratory Systems 41:2, pages 221-235.
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T.K. Yu & S.M. Kang. (1988) Statistical MOS VLSI circuit optimization with non-nested experimental design. Statistical MOS VLSI circuit optimization with non-nested experimental design.