5
Views
8
CrossRef citations to date
0
Altmetric
Original Articles

A study of shallow and deep damage in Cu and Al after self-implantation

, &
Pages 289-314 | Received 10 Aug 1982, Published online: 19 Aug 2006

Keep up to date with the latest research on this topic with citation updates for this article.

Read on this site (1)

Articles from other publishers (7)

G Carter. (1994) Peening in ion-assisted thin-film deposition: a generalized model. Journal of Physics D: Applied Physics 27:5, pages 1046-1055.
Crossref
E. Gerritsen, H.A.A. Keetels & H.J. Ligthart. (1989) Depth selective microstructural analysis of ion implanted metals by cross-section transmission electron microscopy and computer simulation. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 39:1-4, pages 614-618.
Crossref
Awatar Singh. (1987) Removal processes for damage and contamination after CF4/40%H2 reactive ion etching of silicon. Microelectronics Journal 18:5, pages 13-24.
Crossref
H.J. Ligthart, E. Gerritsen, P.J. van Den Kerkhoff, S. Hoekstra, R.E. van De Leest & E. Keetels. (1987) Aluminium implantations in copper. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 19-20, pages 209-212.
Crossref
J.A. Sprague, P.R. Malmberg, J.M. Lambert, P.A. Treado, G.W. Reynolds, G.P. Mueller, M. Rosen & A. Vincenz. (1987) Effect of crystal orientation on sputtering and lattice damage in ion-irradiated copper. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 19-20, pages 75-79.
Crossref
M. Vos & D.O. Boerma. (1986) Lattice damage in single crystals of Cu after self-implantation studied by channeling. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 15:1-6, pages 337-340.
Crossref
F. Pleiter & K. G. Prasad. (1984) Lattice defects in ion-implanted aluminium studied by means of perturbed angular correlations. Hyperfine Interactions 20:4, pages 221-248.
Crossref

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.