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Philosophical Magazine A Volume 77, 1998 - Issue 4
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Original Articles

Defect structure of epitaxial GaN films determined by transmission electron microscopy and triple-axis X-ray diffractometry

T. Metzger TU-München, Institut für Mineralogie and Geochemie, Lichtenbergstr. 4, D-85748, Garching, Germany
,
R. Höpler TU-München, Institut für Mineralogie and Geochemie, Lichtenbergstr. 4, D-85748, Garching, Germany
,
E. Born TU-München, Institut für Mineralogie and Geochemie, Lichtenbergstr. 4, D-85748, Garching, Germany
,
O. Ambacher Walter Schottky Institut, D-85748, TU-Müchen, Am Coulombwall, Garching, Germany
,
M. Stutzmann Walter Schottky Institut, D-85748, TU-Müchen, Am Coulombwall, Garching, Germany
,
R. Stömmer Siemens AG, Otto-Hahn-Ring 6, D-81739, München, Germany
,
M. Schuster Siemens AG, Otto-Hahn-Ring 6, D-81739, München, Germany
,
H. Göbel Siemens AG, Otto-Hahn-Ring 6, D-81739, München, Germany
,
S. Christiansen Universität Erlangen-Nürnberg, Institut für Werkstoffwissenschaften-Mikrocharakterisierung, Cauerstr. 6, D-91058, Erlangen, Germany
,
M. Albrecht Universität Erlangen-Nürnberg, Institut für Werkstoffwissenschaften-Mikrocharakterisierung, Cauerstr. 6, D-91058, Erlangen, Germany
&
H. P. Strunk Universität Erlangen-Nürnberg, Institut für Werkstoffwissenschaften-Mikrocharakterisierung, Cauerstr. 6, D-91058, Erlangen, Germany
 show all
Pages 1013-1025 | Received 25 Feb 1997, Accepted 03 Aug 1997, Published online: 12 Aug 2009

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Engin Arslan, Mustafa K. Öztürk, Süleyman Özçelik & Ekmel Özbay. (2019) Effects of the AlN nucleation layer thickness on the crystal structures of an AlN epilayer grown on the 6H-SiC substrate. Philosophical Magazine 99:14, pages 1715-1731.
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R. Radzali, N. Zainal, F. K. Yam & Z. Hassan. (2014) Characteristics of porous GaN prepared by KOH photoelectrochemical etching. Materials Research Innovations 18:sup6, pages S6-412-S6-416.
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H.Z. Zeng, Y. Lin & C.L. Chen. (2011) Strain Relaxation and Dislocation Evolution in Epitaxial Perovskite Oxide Thin Films. Integrated Ferroelectrics 125:1, pages 73-80.
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A. P. Pathak, S. Dhamodaran, N. Sathish & N. Srinivasa Rao. (2007) Swift heavy-ion modification of semiconductor heterostructures. Radiation Effects and Defects in Solids 162:3-4, pages 131-150.
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