Advanced search
Publication Cover
Radiation Effects Volume 58, 1981 - Issue 5
Journal homepage
9
Views
18
CrossRef citations to date
0
Altmetric
Original Articles

The development of tailed-cones on non normal incidence ion bombarded solids

G. W. Lewis Department of Electrical Engineering, University of Salford, Salford, M5 4WT, U.K.
,
G. Carter Department of Electrical Engineering, University of Salford, Salford, M5 4WT, U.K.
,
M. J. Nobes Department of Electrical Engineering, University of Salford, Salford, M5 4WT, U.K.
&
S. A. Cruz Department of Electrical Engineering, University of Salford, Salford, M5 4WT, U.K.; Instituto de Fisica, Universidad Nacional Autonoma de Mexico, Mexico, DF, 20
Pages 119-124 | Received 05 Apr 1981, Published online: 19 Aug 2006

Citations (18)

Keep up to date with the latest research on this topic with citation updates for this article.

Subscribe to citation updates

Read on this site (2)

G. Carter & M.J. Nobes. (1985) The formation and evolution of edges on sputter-eroded surfaces. Philosophical Magazine A 51:5, pages 745-763.
Read now
Orlando Auciello & Roger Kelly. (1982) The evolution of pyramidal structures on surfaces bombarded at oblique angles. Radiation Effects 66:3-4, pages 195-210.
Read now

Articles from other publishers (16)

A. K. Sen & D. Ghose. (1993) Ar+-ion sputtering-induced surface topography development on aluminium. Journal of Materials Science 28:6, pages 1525-1531.
Crossref
T.K. Chini, S.R. Bhattacharyya, D. Ghose & D. Basu. (1992) Oblique cone formation in Ge by Ar+ sputtering. Vacuum 43:3, pages 219-222.
Crossref
S. Morishita, M. Tanemura, Y. Fujimoto & F. Okuyama. (1988) High-resolution electron microscopy of Si cones formed on Ar+-bombarded Si wafers. Applied Physics A Solids and Surfaces 46:4, pages 313-321.
Crossref
S. Morishita, M. Tanemura, Y. Fujimoto & F. Okuyama. (1988) High-resolution electron microscopy of Si cones formed on Ar+-bombarded Si wafers. Applied Physics A Solids and Surfaces 46:4, pages 313-321.
Crossref
G. Carter, M.J. Nobes, R. Smith & M.A. Tagg. (1986) The development of surface discontinuities (edges) during sputtering induced erosion of solids. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 13:1-3, pages 396-402.
Crossref
G. Carter, M.J. Nobes, I.V. Katardjiev, J.L. Whitton & G. Kiriakidis. (1986) The effect of ion species on topography evolution. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 18:1-6, pages 529-532.
Crossref
M. J. Nobes. 1986. Erosion and Growth of Solids Stimulated by Atom and Ion Beams. Erosion and Growth of Solids Stimulated by Atom and Ion Beams 103 120 .
Orlando Auciello. 1986. Erosion and Growth of Solids Stimulated by Atom and Ion Beams. Erosion and Growth of Solids Stimulated by Atom and Ion Beams 394 422 .
G. Carter, M. J. Nobes & J. L. Whitton. (1985) Sputtering induced topography development on f.c.c. metals. Applied Physics A Solids and Surfaces 38:2, pages 77-95.
Crossref
G. Carter, M. J. Nobes, G. W. Lewis & C. R. Brown. (2004) The effect of surface topography evolution on sputter profiling depth resolution in Si. Surface and Interface Analysis 7:1, pages 35-40.
Crossref
F. Vasiliu & S. Frunza. (1984) The interdependence between the incidence angles associated with quasi-stable intersections during ion erosion. Journal of Materials Science 19:7, pages 2153-2164.
Crossref
G. Carter, G.W. Lewis, M.J. Nobes, J. Cox & W. Begemann. (1984) The effect of ion species on bombardment induced topography during ion etching of silicon. Vacuum 34:3-4, pages 445-450.
Crossref
F. Vasiliu & S. Frunza. (1983) Analytical and graphical evaluation of local quasi-stable angular points during ion bombardment at oblique incidence. Journal of Materials Science 18:12, pages 3562-3570.
Crossref
G Carter, MJ Nobes, GW Lewis & JL Whitton. (1983) The formation of striations on oblique boundaries during sputtering. Vacuum 33:7, pages 373-380.
Crossref
Jean -Claude Pivin. (1983) An overview of ion sputtering physics and practical implications. Journal of Materials Science 18:5, pages 1267-1290.
Crossref
G.D. RobertsonJr.Jr., P.K. Vasudev, R.G. Wilson & V.R. Deline. (1982) Analysis of Al in silicon on sapphire films and bulk silicon. Applications of Surface Science 14:1, pages 128-133.
Crossref

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Order Reprints Request Corporate Permissions

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

Request Academic Permissions

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.

Related research

People also read lists articles that other readers of this article have read.

Recommended articles lists articles that we recommend and is powered by our AI driven recommendation engine.

Cited by lists all citing articles based on Crossref citations.
Articles with the Crossref icon will open in a new tab.