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Quality Engineering Volume 13, 2001 - Issue 4
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Original Articles

THE EFFECT OF QUALITY LOSSES ON BINOMIAL YIELD PROCESSES

Gail W. DePuy Department of Industrial Engineering, University of Louisville Louisville, Kentucky, 40292
&
John S. Usher Department of Industrial Engineering, University of Louisville Louisville, Kentucky, 40292
Pages 595-600 | Published online: 29 Mar 2007

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LisaM. Maillart, C. Richard Cassady & Jason Honeycutt. (2008) A binomial approximation of lot yield under Markov modulated Bernoulli item yield. IIE Transactions 40:4, pages 459-467.
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Articles from other publishers (1)

Işılay Talay & Öznur Özdemir-Akyıldırım. (2019) Optimal procurement and production planning for multi-product multi-stage production under yield uncertainty. European Journal of Operational Research 275:2, pages 536-551.
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