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Philosophical Magazine Letters Volume 59, 1989 - Issue 2
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Original Articles

Surface polarity determination in 〈110〉-orientated compound semiconductors high-resolution electron microscopy

David J. Smith Center for Solid State Science and Department of Physics, Arizona State University, Tempe, Arizona, 85287, U.S.A.
,
Rob W. Glaisher Center for Solid State Science and Department of Physics, Arizona State University, Tempe, Arizona, 85287, U.S.A.
&
Ping Lu Center for Solid State Science and Department of Physics, Arizona State University, Tempe, Arizona, 85287, U.S.A.
Pages 69-75 | Received 01 Oct 1988, Accepted 18 Oct 1988, Published online: 20 Aug 2006

Citations (15)

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Read on this site (3)

P. Vermaut, P. Ruterana & G. Nouet. (1997) Polarity of epitaxial layers and (1210)prismatic defects in GaN and AIN grown on the (0001)Si surface of 6H-SiC. Philosophical Magazine A 76:6, pages 1215-1234.
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K. Watanabe, K. Hiratsuka & H. Yamaguchi. (1991) (100) Lattice images of GaAs and ZnSe crystals. Philosophical Magazine A 64:1, pages 81-86.
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Ping Lu & DavidJ. Smith. (1990) Dissociated 60° dislocations in CdTe studied by high-resolution electron microscopy. Philosophical Magazine B 62:4, pages 435-450.
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Articles from other publishers (12)

Angus I. Kirkland, Shery L.-Y. Chang & John L. Hutchison. 2019. Springer Handbook of Microscopy. Springer Handbook of Microscopy 3 47 .
Y.X. Cui, Y.M. Wang, C. Wen, B.H. Ge, F.H. Li, Y. Chen & H. Chen. (2013) Determining polarity and dislocation core structures at atomic level for epitaxial AlN/(0 0 0 1)6H-SiC from a single image in HRTEM. Ultramicroscopy 126, pages 77-84.
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Angus I. Kirkland, Peter D. Nellist, Lan-Yun Chang & Sarah J. Haigh. 2008. Advances in IMAGING AND ELECTRON PHYSICS - Aberration–Corrected Electron Microscopy. Advances in IMAGING AND ELECTRON PHYSICS - Aberration–Corrected Electron Microscopy 283 325 .
J. N. Stirman, F. A. Ponce, A. Pavlovska, I. S. T. Tsong & David J. Smith. (2000) Polarity determination and atomic arrangements at a GaN/SiC interface using high-resolution image matching. Applied Physics Letters 76:7, pages 822-824.
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David J Smith. (1997) The realization of atomic resolution with the electron microscope. Reports on Progress in Physics 60:12, pages 1513-1580.
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Mihály Pósfai & Peter R. Buseck. 1997. Modular Aspects of Minerals. Modular Aspects of Minerals 193 235 .
S.-C.Y. Tsen, David J. Smith, J.W. Hutchins, B.J. Skromme, Y.P. Chen & S. Sivananthan. (1996) Heteroepitaxial CdTe(111) grown by MBE on nominally flat and misoriented Si(001) substrates: characterization by electron microscopy and optical methods. Journal of Crystal Growth 159:1-4, pages 58-63.
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Kazuto Watanabe. 1993. Advances in Electronics and Electron Physics Volume 86. Advances in Electronics and Electron Physics Volume 86 173 224 .
C. B. Duke. 1993. Advances in Solid State Physics 33. Advances in Solid State Physics 33 1 36 .
David J. Smith, Rob W. Glaisher, Z. G. Li, Ping Lu, M. R. McCartney, S. C. Y. Tsen & A. K. Datye. (2013) Recent studies of thin films and surfaces by high-Resolution electron microscopy. Metallurgical Transactions A 23:4, pages 1063-1070.
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Ping Lu & David J. Smith. (1991) Direct imaging of CdTe(001) surface reconstructions by high-resolution electron microscopy. Surface Science 254:1-3, pages 119-124.
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A. C. Wright & J. O. Williams. 1991. Electronic Materials. Electronic Materials 225 251 .

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