Effect of leakage current through ferroelectric and insulator on retention characteristics of metal-ferroelectric-insulator-semiconductor structure

Mitsue Takahashi Area of Materials and Device Physics, Department of Physical Science, Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama-cho, Toyonaka, 560-8531, Japan

Kazushi Kodama Area of Materials and Device Physics, Department of Physical Science, Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama-cho, Toyonaka, 560-8531, Japan

Toshiyuki Nakaiso Area of Materials and Device Physics, Department of Physical Science, Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama-cho, Toyonaka, 560-8531, Japan

Minoru Noda Area of Materials and Device Physics, Department of Physical Science, Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama-cho, Toyonaka, 560-8531, Japan

Masanori Okuyama Area of Materials and Device Physics, Department of Physical Science, Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama-cho, Toyonaka, 560-8531, Japan

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LE VAN HAI, TAKESHI KANASHIMA & MASANORI OKUYAMA. (2006) IMPROVEMENT OF MEMORY RETENTION IN METAL-FERROELECTRIC-INSULATOR-SEMICONDUCTOR STRUCTURE BY SrBi2Ta2O9 SURFACE MODIFICATION INDUCED BY NITROGEN AND OXYGEN RADICAL IRRADIATION. Integrated Ferroelectrics 84:1, pages 179-188.
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O Polat, M Coskun, H Efeoglu, M Caglar, F M Coskun, Y Caglar & A Turut. (2020) The temperature induced current transport characteristics in the orthoferrite YbFeO 3− δ thin film/p-type Si structure . Journal of Physics: Condensed Matter 33:3, pages 035704.
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Zerun Yin, Bobo Tian, Qiuxiang Zhu & Chungang Duan. (2019) Characterization and Application of PVDF and Its Copolymer Films Prepared by Spin-Coating and Langmuir–Blodgett Method. Polymers 11:12, pages 2033.
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K C Chan, P F Lee, D F Li & J Y Dai. (2011) Memory characteristics and the tunneling mechanism of Au nanocrystals embedded in a DyScO 3 high- k gate dielectric layer . Semiconductor Science and Technology 26:2, pages 025015.
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Mitsue Takahashi, Minoru Noda & Masanori Okuyama. (2011) X-ray Photoelectron and UV Photoyield Spectroscopic Studies on Structural and Electronic Properties of Sr x Bi y Ta 2 O 9 Films . MRS Proceedings 748.
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Effect of leakage current through ferroelectric and insulator on retention characteristics of metal-ferroelectric-insulator-semiconductor structure

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Effect of leakage current through ferroelectric and insulator on retention characteristics of metal-ferroelectric-insulator-semiconductor structure

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