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Integrated Ferroelectrics
An International Journal
Volume 10, 1995 - Issue 1-4
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Characterization and testing

The imprint mechanism in ferroelectric capacitors

Joe T. Evans Jr. Radiant Technologies, Inc., Albuquerque, NM, USA
&
Hayley E. Cardoza Radiant Technologies, Inc., Albuquerque, NM, USA
Pages 267-277 | Received 18 Apr 1995, Published online: 19 Aug 2006

Citations (11)

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Read on this site (5)

Y. Fujii, D. Nagasawa, H. Nozawa, K. Kobayashi & K. Tamaru. (2001) Physical insights on imprint and application to functional memory with ferroelectric materials. Integrated Ferroelectrics 33:1-4, pages 261-270.
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M. Grossmann, O. Lohse, D. Bolten, R. Waser, W. Hartner, G. Schindler, C. Dehm, N. Nagel, V. Joshi, N. Solayappan & G. Derbenwick. (1998) Imprint in ferroelectric SrBi2Ta2O9 capacitors for non-volatile memory applications. Integrated Ferroelectrics 22:1-4, pages 95-107.
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RobbertI. Suizu & ScottP. Chapman. (1997) The effects of ferroelectric capacitor testing methods on predicted imprint failure points. Integrated Ferroelectrics 16:1-4, pages 87-96.
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S.D. Traynor, T.D. Hadnagy & L. Kammerdiner. (1997) Capacitor test simulation of retention and imprint characteristics for ferroelectric memory operation. Integrated Ferroelectrics 16:1-4, pages 63-76.
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J.M. Benedetto. (1997) Imprint induced failure modes in ferroelectric non-volatile memories. Integrated Ferroelectrics 15:1-4, pages 29-38.
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Articles from other publishers (6)

Fanmao Liu, Ignasi Fina, Riccardo Bertacco & Josep Fontcuberta. (2016) Unravelling and controlling hidden imprint fields in ferroelectric capacitors. Scientific Reports 6:1.
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Joe Evans, Naomi Montross, Gerald Salazar, Bob Howard, Spencer Smith, Scott Chapman & Allen Gallegos. (2012) A discrete ferroelectric memory. A discrete ferroelectric memory.
M. Grossmann, O. Lohse, D. Bolten, U. Boettger, R. Waser, W. Hartner, M. Kastner & G. Schindler. (2000) Lifetime estimation due to imprint failure in ferroelectric SrBi2Ta2O9 thin films. Applied Physics Letters 76:3, pages 363-365.
Crossref
T. Tamura, K. Matsuura, H. Ashida, K. Kondo & S. Otani. (1999) Hysteresis variations of (Pb, La)(Zr, Ti)O3 capacitors baked in a hydrogen atmosphere. Applied Physics Letters 74:22, pages 3395-3397.
Crossref
Akira Furuya & Joe D. Cuchiaro. (1998) Compositional dependence of electrical characteristics of SrBi2(Ta1−xNbx)2O9 thin-film capacitors. Journal of Applied Physics 84:12, pages 6788-6794.
Crossref
M. Grossmann, O. Lohse, D. Bolten, R. Waser, W. Hartner, G. Schindler, N. Nagel & C. Dehm. (2011) Origin of Imprint in Ferroelectric CSD SrBi 2 Ta 2 O 9 Thin Films . MRS Proceedings 541.
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