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Abstract
The development of a preferential state in FE capacitors due to prolonged storage in a particular memory state, i.e. “preferential aging induced imprint,” causes a significant vulnerability in FE non-volatile memories. Imprint due to repeated rewriting of the capacitor or by the application of a DC bias, i.e. “external bias induced imprint,” appears to be much more common in FE capacitors than preferential aging induced imprint, but may not pose as serious a problem from a reliability standpoint.