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Integrated Ferroelectrics
An International Journal
Volume 10, 1995 - Issue 1-4
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Applications and devices—microwave and diverse

Structural and dielectric properties of Ba0.5Sr0.5TiO3 thin films grown on Si by off-axis sputtering

Shang Y. Hou AT&T Bell Laboratories, Murray Hill, New Jersey, 07974
,
J. Kwo AT&T Bell Laboratories, Murray Hill, New Jersey, 07974
,
R. K. Watts AT&T Bell Laboratories, Murray Hill, New Jersey, 07974
,
J.-Y. Cheng AT&T Bell Laboratories, Murray Hill, New Jersey, 07974
&
D. K. Fork Xerox Palo Alto Research Center, Palo Alto, California, 94304
Pages 343-350 | Received 05 Apr 1995, Published online: 19 Aug 2006

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HONGWEI CHEN, CHUANREN YANG, CHUNLIN FU, SHUCHENG FENG & YAFANG PEI. (2006) EFFECTS OF SUBSTRATE TEMPERATURE AND TARGET-SUBSTRATE DISTANCE ON THE DIELECTRIC NON-LINEARITY OF Ba0.6Sr0.4TiO3 THIN FILM. Integrated Ferroelectrics 82:1, pages 101-108.
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Rajmo Jammy & LauraA. Wills. (1997) High frequency electrical characterization of bst capacitors. Integrated Ferroelectrics 15:1-4, pages 235-243.
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