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Integrated Ferroelectrics
An International Journal
Volume 11, 1995 - Issue 1-4
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Original Articles

Breakdown mechanisms in PZT thin film capacitors

In Kyeong Yoo Samsung Advanced Institute of Technology, P.O. Box 111, Suwon, Kyongki, 440–600, Korea
,
Chang Jung Kim Samsung Advanced Institute of Technology, P.O. Box 111, Suwon, Kyongki, 440–600, Korea
&
Seshu B. Desu Department of Materials Science and Engineering, VA Tech, Blacksburg, VA24061
Pages 269-275 | Received 05 Apr 1995, Published online: 19 Aug 2006

Citations (7)

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Read on this site (1)

I. Stolichnov, A. Tagantsev, N. Setter, S. Okhonin, P. Fazan, J.S. Cross, M. Tsukada, A. Bartic & D. Wouters. (2001) Constant-current study of dielectric breakdown of Pb(Zr,Ti)O3 ferroelectric film capacitors. Integrated Ferroelectrics 32:1-4, pages 45-54.
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Articles from other publishers (6)

Beihai Ma, Do-Kyun Kwon, Manoj Narayanan & U (Balu) Balachandran. (2008) Leakage current characteristics and dielectric breakdown of antiferroelectric Pb 0.92 La 0.08 Zr 0.95 Ti 0.05 O 3 film capacitors grown on metal foils . Journal of Physics D: Applied Physics 41:20, pages 205003.
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Nina Balke, Doru C. Lupascu, Thomas Blair & Alexei Gruverman. (2006) Thickness profiles through fatigued bulk ceramic lead zirconate titanate. Journal of Applied Physics 100:11.
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In Kyeong Yoo. 2004. Nanoscale Phenomena in Ferroelectric Thin Films. Nanoscale Phenomena in Ferroelectric Thin Films 3 38 .
Wei-Tang Li, David R McKenzie, William D McFall, Qi-Chu Zhang & Witold Wiszniewski. (2000) Breakdown mechanism of Al2O3 based metal-to-metal antifuses. Solid-State Electronics 44:9, pages 1557-1562.
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I. Stolichnov, A. Tagantsev, N. Setter, S. Okhonin, P. Fazan, J. S. Cross & M. Tsukada. (2000) Dielectric breakdown in (Pb,La)(Zr,Ti)O3 ferroelectric thin films with Pt and oxide electrodes. Journal of Applied Physics 87:4, pages 1925-1931.
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In Kyeong Yoo, I.S. Chung, C.J. Kim, J.K. Lee, B.K. Jeon & S.B. Desu. (2011) Pyroelectric Effects on 1T-1C Fram and 1Tr Fram. MRS Proceedings 541.
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