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Publication Cover
Integrated Ferroelectrics
An International Journal
Volume 11, 1995 - Issue 1-4
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Original Articles

Breakdown mechanisms in PZT thin film capacitors

In Kyeong Yoo Samsung Advanced Institute of Technology, P.O. Box 111, Suwon, Kyongki, 440–600, Korea
,
Chang Jung Kim Samsung Advanced Institute of Technology, P.O. Box 111, Suwon, Kyongki, 440–600, Korea
&
Seshu B. Desu Department of Materials Science and Engineering, VA Tech, Blacksburg, VA24061
Pages 269-275 | Received 05 Apr 1995, Published online: 19 Aug 2006

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