Citations (47)
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Jeffrey S Cross, Seung-Hyun Kim, Satoshi Wada & Abhijit Chatterjee. (2010) Characterization of Bi and Fe co-doped PZT capacitors for FeRAM. Science and Technology of Advanced Materials 11:4.
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Fan Chu, Glen Fox & Tom Davenport. (2001) High endurance scaled plzt thin films for fram applications. Integrated Ferroelectrics 36:1-4, pages 43-52.
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Shan Sun, GlenR. Fox & Fan Chu. (2001) Comparison of sputtered SBTN and PLZT thin film capacitors for FRAM applications. Integrated Ferroelectrics 39:1-4, pages 109-118.
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Shan Sun, GlenR. Fox & T.
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JeffreyS. Cross, Mitsushi Fujiki, Mineharu Tsukada, Katsuyoshi Matsuura, Seigen Otani, Miki Tomotani, Yuji Kataoka, Yasutoshi Kotaka & Yasuyuki Goto. (1999) Evaluation of PZT capacitors with Pt/SrRuO3 electrodes for feram. Integrated Ferroelectrics 25:1-4, pages 265-273.
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JeffreyS. Cross, Mitsushi Fujiki, Mineharu Tsukada, Yasutoshi Kotaka & Yasuyuki Goto. (1998) Characterization of PZT capacitors with SrRuO3 electrodes. Integrated Ferroelectrics 21:1-4, pages 263-271.
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Elliott Philofsk & Sanjay Mitra. (1998) A qualitative model for degradation of FRAM® products during plastic packaging. Integrated Ferroelectrics 21:1-4, pages 145-153.
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Deborah White, Terri Culbreth & Sanjay Mitra. (1998) Optimization of plastic packaging of ferroelectric semiconductor memories. Integrated Ferroelectrics 21:1-4, pages 115-126.
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Shan Sun, John Belsick, Hiroto Uchida & Tsutomu Atsuki. (1998) Crystallographic orientation control for ferroelectric SBT and SBTN thin films from photosensitive mod solutions. Integrated Ferroelectrics 22:1-4, pages 55-63.
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T.D. Hadnagy. (1997) Materials and production characterization requirements for the production of FRAM® memory products. Integrated Ferroelectrics 18:1-4, pages 1-17.
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