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Integrated Ferroelectrics
An International Journal
Volume 19, 1998 - Issue 1-4
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Original Articles

Structural and dielectric properties of Ba0.5Sr0.5TiO3 thin films with an epi-RuO2 bottom electrode

Q. X. Jia Materials Science and Technology Division, Mail Stop K763, Los Alamos National Laboratory, Los Alamos, NM, 87545, USA; E-mail: [email protected]
,
A. T. Findikoiglu Materials Science and Technology Division, Mail Stop K763, Los Alamos National Laboratory, Los Alamos, NM, 87545, USA
,
R. Zhou Materials Science and Technology Division, Mail Stop K763, Los Alamos National Laboratory, Los Alamos, NM, 87545, USA
,
S. R. Foltyn Materials Science and Technology Division, Mail Stop K763, Los Alamos National Laboratory, Los Alamos, NM, 87545, USA
,
X. D. Wu Materials Science and Technology Division, Mail Stop K763, Los Alamos National Laboratory, Los Alamos, NM, 87545, USA
,
J. L. Smith Materials Science and Technology Division, Mail Stop K763, Los Alamos National Laboratory, Los Alamos, NM, 87545, USA
,
Q. Wang Department of Materials Science and Chemical Engineering, University of Minnesota, Minneapolis, MN, 55455, USA
,
D. F. Evans Department of Materials Science and Chemical Engineering, University of Minnesota, Minneapolis, MN, 55455, USA
&
W. L. Gladfelter Department of Materials Science and Chemical Engineering, University of Minnesota, Minneapolis, MN, 55455, USA
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Pages 111-119 | Received 05 Feb 1997, Published online: 03 Sep 2006

Citations (3)

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Read on this site (1)

Q.X. Jia, C. Kwon & P. Lu. (1999) Structural properties of Ba0.6Sr0.4TiO3 thin films on epitaxial RuO2 electrodes. Integrated Ferroelectrics 24:1-4, pages 57-63.
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Articles from other publishers (2)

Quanxi Jia. 2002. Handbook of Thin Films. Handbook of Thin Films 677 698 .
James F. ScottJames F. Scott. 2000. Ferroelectric Memories. Ferroelectric Memories 165 174 .

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