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Integrated Ferroelectrics
An International Journal
Volume 19, 1998 - Issue 1-4
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Original Articles

Analysis of preferred orientations in PST and PZT thin films on various substrates

D. Chateigner Laboratoire de Cristallographie-CNRS, BP 166, 38042, Grenoble, France; Department of Geology and Geophysics, Univ. of California, Berkeley, CA, 94720, USA
,
H.-R. Wenk Laboratoire de Cristallographie-CNRS, BP 166, 38042, Grenoble, France; Department of Geology and Geophysics, Univ. of California, Berkeley, CA, 94720, USA
,
A. Patel GEC-Marconi Materials Technology Limited, Northamptonshire, NN12 8EQ, U. K
,
M. Todd Defence Research Agency, Malvern, Worcestershire, U. K
&
D. J. Barber Department of physics, Hong Kong Univ. of Science and Technology, Hong Kong; School of Industrial and Manufacturing Science, Cranfield Univ., Cranfield, Bedfordshire, MK430AL, U. K.
Pages 121-140 | Published online: 03 Sep 2006

Citations (14)

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Read on this site (2)

J. Ricote, D. Chateigner, L. Pardo, M. Algueró, J. Mendiola & M.L. Calzada. (2000) Quantitative analysis of preferential orientation components of ferroelectric thin films. Ferroelectrics 241:1, pages 167-174.
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MikeA. Todd, PaulP. Donohue, JasonC. Jones, DavidJ. Wallis, MikeJ. Slater, MarkA. Harper & Rex Watton. (1999) Deposition and annealing of lead scandium tantalate thin films for high performance thermal detector arrays. Integrated Ferroelectrics 25:1-4, pages 113-123.
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Articles from other publishers (12)

R. V. Selyukov & V. V. Naumov. (2020) The Influence of Film Thickness on the Annealing-Induced Changes of Texture and of the Fraction of Crystalline Phase in Pt Films. Technical Physics 65:5, pages 762-770.
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Giovanni Esteves, Chris M. Fancher & Jacob L. Jones. (2014) In situ characterization of polycrystalline ferroelectrics using x-ray and neutron diffraction. Journal of Materials Research 30:3, pages 340-356.
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P. Boullay, L. Lutterotti, D. Chateigner & L. Sicard. (2014) Fast microstructure and phase analyses of nanopowders using combined analysis of transmission electron microscopy scattering patterns. Acta Crystallographica Section A Foundations and Advances 70:5, pages 448-456.
Crossref
Hans‐Rudolf Wenk. 2012. Modern Diffraction Methods. Modern Diffraction Methods 173 220 .
G. Leclerc, G. Poullain, R. Bouregba & D. Chateigner. (2009) Influence of the substrate on ferroelectric properties of 〈111〉 oriented rhombohedral Pb(Zr0.6Ti0.4)O3 thin films. Applied Surface Science 255:7, pages 4293-4297.
Crossref
R. Desfeux, C. Legrand, A. Da Costa, D. Chateigner, R. Bouregba & G. Poullain. (2006) Correlation between local hysteresis and crystallite orientation in PZT thin films deposited on Si and MgO substrates. Surface Science 600:1, pages 219-228.
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Mohamed Y. El-Naggar, David A. Boyd & David G. Goodwin. (2011) Characterization of Highly-Oriented Ferroelectric Pb x Ba 1−x TiO 3 Thin Films Grown by Metalorganic Chemical Vapor Deposition . Journal of Materials Research 20:11, pages 2969-2976.
Crossref
H-R Wenk & P Van Houtte. (2004) Texture and anisotropy. Reports on Progress in Physics 67:8, pages 1367-1428.
Crossref
J. Ricote, D. Chateigner, M. Morales, M.L. Calzada & C. Wiemer. (2004) Application of the X-ray combined analysis to the study of lead titanate based ferroelectric thin films. Thin Solid Films 450:1, pages 128-133.
Crossref
Jesús Ricote, Rosalía Poyato, Miguel Algueró, Lorena Pardo, M. Lourdes Calzada & Daniel Chateigner. (2004) Texture Development in Modified Lead Titanate Thin Films Obtained by Chemical Solution Deposition on Silicon‐Based Substrates. Journal of the American Ceramic Society 86:9, pages 1571-1577.
Crossref
C.W. Tai, K.Z. Baba-kishi & K.H. Wong. (2002) Microtexture characterization of PZT ceramics and thin films by electron microscopy. Micron 33:6, pages 581-586.
Crossref
M. Klee, H. van Hal, W. Keur, W. Brand, R. Kiewitt, U. Mackens & C. Metzmacher. 2001. Handbook of Advanced Electronic and Photonic Materials and Devices. Handbook of Advanced Electronic and Photonic Materials and Devices 195 217 .

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