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Integrated Ferroelectrics
An International Journal
Volume 19, 1998 - Issue 1-4
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Original Articles

Analysis of preferred orientations in PST and PZT thin films on various substrates

D. Chateigner Laboratoire de Cristallographie-CNRS, BP 166, 38042, Grenoble, France; Department of Geology and Geophysics, Univ. of California, Berkeley, CA, 94720, USA
,
H.-R. Wenk Laboratoire de Cristallographie-CNRS, BP 166, 38042, Grenoble, France; Department of Geology and Geophysics, Univ. of California, Berkeley, CA, 94720, USA
,
A. Patel GEC-Marconi Materials Technology Limited, Northamptonshire, NN12 8EQ, U. K
,
M. Todd Defence Research Agency, Malvern, Worcestershire, U. K
&
D. J. Barber Department of physics, Hong Kong Univ. of Science and Technology, Hong Kong; School of Industrial and Manufacturing Science, Cranfield Univ., Cranfield, Bedfordshire, MK430AL, U. K.
Pages 121-140 | Published online: 03 Sep 2006

References

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