34
Views
40
CrossRef citations to date
0
Altmetric
Original Articles

High-resolution electron microscopy of structural defects in crystalline C60 and C70

, &
Pages 443-463 | Received 03 Aug 1992, Accepted 06 Sep 1992, Published online: 20 Nov 2006

Keep up to date with the latest research on this topic with citation updates for this article.

Read on this site (3)

T. Komatsu, M. Tachibana & K. Kojima. (2001) Plastic deformation of C60 single crystals. Philosophical Magazine A 81:3, pages 659-666.
Read now
P. Saint-gregoire, R. Almairac, E. Snoeck, J. Moret & V. Kopsky. (1999) Structural organization of fullerenes C60, C70, C84 . Ferroelectrics 221:1, pages 37-46.
Read now
Annick Loiseau. (1996) Study of Fullerenes, Nanotubes and Nanowires by Transmission Electron Microscopy. Fullerene Science and Technology 4:6, pages 1263-1277.
Read now

Articles from other publishers (37)

Oleg I. Lebedev, Sara Bals, Gustaaf Van Tendeloo, G. Etienne Snoeck, Richard Retoux, Sophie Boudin & Maryvonne Hervieu. (2022) Mixed (Sr 1 − x Ca x ) 33 Bi 24 Al 48 O 141 fullerenoids: the defect structure analysed by (S)TEM techniques . International Journal of Materials Research 97:7, pages 978-984.
Crossref
S. V. Lubenets, L. S. Fomenko, V. D. Natsik & A. V. Rusakova. (2019) Low-temperature mechanical properties of fullerites: structure, elasticity, plasticity, strength. Low Temperature Physics 45:1, pages 1-38.
Crossref
J. F. M. Hardigree, I. R. Ramirez, G. Mazzotta, C. Nicklin & M. Riede. (2017) In-situ observation of stacking fault evolution in vacuum-deposited C60 . Applied Physics Letters 111:23.
Crossref
Carla Bittencourt & Gustaaf Van Tendeloo. 2012. Handbook of Nanoscopy. Handbook of Nanoscopy 995 1070 .
Michael B. Kerber, Michael J. Zehetbauer, Erhard Schafler, Florian C. Spieckermann, Sigrid Bernstorff & Tamas Ungar. (2011) X-ray line profile analysis—An ideal tool to quantify structural parameters of nanomaterials. JOM 63:7, pages 61-70.
Crossref
M. Feuerbacher & M. Heggen. 2010. 109 170 .
N Aota, M Tachibana & K Kojima. (2008) Dislocation motions in C 60 crystals by an indentation test . Journal of Physics D: Applied Physics 41:7, pages 074002.
Crossref
Oleg I. Lebedev, Sara Bals, Gustaaf Van Tendeloo, Etienne Snoeck, Richard Retoux, Sophie Boudin & Maryvonne Hervieu. (2006) Mixed (Sr 1?x Ca x ) 33 Bi 24 Al 48 O 141 fullerenoids: the defect structure analysed by (S)TEM techniques . International Journal of Materials Research 97:7, pages 978-984.
Crossref
S. V. Lubenets. (2005) Cleavage of C[sub 60] Fullerite Crystals. Physics of the Solid State 47:5, pages 891.
Crossref
A. P. Isakina, A. I. Prokhvatilov, M. A. Strzhemechny & K. A. Yagotintsev. (2001) Structure, lattice parameters, and thermal expansion anisotropy of C70 fullerite. Low Temperature Physics 27:12, pages 1037-1047.
Crossref
Ph. Komninou, G. Nouet, P. Patsalas, Th. Kehagias, M. Gioti, S. Logothetidis & Th. Karakostas. (2000) Crystalline structures of carbon complexes in amorphous carbon films. Diamond and Related Materials 9:3-6, pages 703-706.
Crossref
Aleksandr V. Eletskii. (2000) Endohedral structures. Uspekhi Fizicheskih Nauk 170:2, pages 113.
Crossref
Shulin Wen & Qian Liu. (1998) High resolution electron microscopy investigations of interface and other structure defects in some ceramics. Microscopy Research and Technique 40:3, pages 177-186.
Crossref
Shankar Prasad Shrestha & Dhananjai Pandey. 1998. Frontiers in Materials Modelling and Design. Frontiers in Materials Modelling and Design 339 347 .
F. E. Fujita. 1998. Physics of New Materials. Physics of New Materials 141 181 .
. 1997. Electron Microscopy. Electron Microscopy 2 301 .
Shankar Prasad Shrestha & Dhananjai Pandey. (1997) Kinetics of martensitic type restacking transitions: dynamic scaling, universal growth exponent and evolution of diffuse scattering. Proceedings of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences 453:1961, pages 1311-1330.
Crossref
Douglas L. Dorset & John R. Fryer. (1997) Electron Crystallographic Analysis of Sublimed C 70 Buckminsterfullerene . The Journal of Physical Chemistry B 101:20, pages 3968-3972.
Crossref
D. Bernaerts & Severin Amelinckx. 1996. Handbook of Microscopy. Handbook of Microscopy 437 482 .
. 1996. Handbook of Microscopy. Handbook of Microscopy 353 406 .
. 1996. Handbook of Microscopy Set. Handbook of Microscopy Set 353 406 .
. 1996. Handbook of Microscopy Set. Handbook of Microscopy Set 437 482 .
S.P. Shrestha, V. Tripathi, V.K. Kabra & Dhananjai Pandey. (1996) Monte Carlo study of the evolution of diffuse scattering and coherent modulation during h.c.p. to f.c.c. martensitic transition—I. Infinitely strong repulsive interaction model. Acta Materialia 44:12, pages 4937-4947.
Crossref
D. Bernaerts, G. Van Tendeloo, S. Amelinckx, K. Hevesi, G. Gensterblum, L. M. Yu, J.-J. Pireaux, F. Grey & J. Bohr. (1996) Structural defects and epitaxial rotation of C60 and C70(111) films on GeS(001). Journal of Applied Physics 80:6, pages 3310-3318.
Crossref
S. P Shrestha & D Pandey. (1996) Application of 1d kinetic Ising model for studying the evolution of diffuse scattering during HCP (2H) to FCC (3C) martensitic transition. Europhysics Letters (EPL) 34:4, pages 269-274.
Crossref
E Blanc, H.-B Bürgi, R Restori, D Schwarzenbach & Ph Ochsenbein. (1996) X-ray diffraction study of the stacking faults in hexagonal C 70 single crystals . Europhysics Letters (EPL) 33:3, pages 205-210.
Crossref
Douglas L. Dorset. (1996) Binary Phases of C 60 and C 70 Buckminsterfullerenes:  An Electron Crystallographic Study . The Journal of Physical Chemistry 100:41, pages 16706-16710.
Crossref
Gustaaf Van Tendeloo. 1996. Stability of Materials. Stability of Materials 473 507 .
D. Schryvers, G. Van Tendeloo, J. Van Landuyt & S. Amelinckx. (1995) Some examples of electron microscopy studies of microstructures and phase transitions in solids. Meccanica 30:5, pages 433-438.
Crossref
N. Wang, K.K. Fung & R.F. Xiao. (1995) High resolution electron microscopy study of as-grown, crushed and cleaved C60 crystals. Surface Science 328:1-2, pages L539-L545.
Crossref
L. Nistor, G. van Tendeloo, S. Amelinckx & C. Cros. (1994) Atomic imaging of cage-like structures of silicon. Physica Status Solidi (a) 146:1, pages 119-132.
Crossref
H. Yanagi & T. Sasaki. (1994) Epitaxial growth of C 60 and KI(001) surface . Applied Physics Letters 65:10, pages 1222-1223.
Crossref
R. Beyers, C.-H. Kiang, R. D. Johnson, J. R. Salem, M. S. de Vries, C. S. Yannoni, D. S. Bethune, H. C. Dorn, P. Burbank, K. Harich & S. Stevenson. (1994) Preparation and structure of crystals of the metallofullerene Sc2@C84. Nature 370:6486, pages 196-199.
Crossref
X.F. Zhang, X.B. Zhang, D. Bernaerts, G. Van Tendeloo, S. Amelinckx, J. Van Landuyt & H. Werner. (1994) A simple preparation method of air-sensitive specimens for transmission electron microscopy demonstrated by Rb6C60. Ultramicroscopy 55:1, pages 25-30.
Crossref
Gavin B.M. Vaughan, Paul A. Heiney, David E. Cox, John E. Fischer, Andrew R. McGhie, Allan L. Smith, Robert M. Strongin, Maria A. Cichy & Amos B. SmithIIIIII. (1993) Structural phase transitions and orientational ordering in C70. Chemical Physics 178:1-3, pages 599-613.
Crossref
John E. Fischer & Paul A. Heiney. (1993) Order and disorder in fullerene and fulleride solids. Journal of Physics and Chemistry of Solids 54:12, pages 1725-1757.
Crossref
M.A. Verheijen, W.J.P. van Enckevort & G. Meijer. (1993) Growth phenomena on C60 crystals. Chemical Physics Letters 216:1-2, pages 72-80.
Crossref

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.