Serially connected tantalum and amorphous indium tin oxide for sensing the temperature increase in IGZO thin-film transistor backplanes

EunSeong Yua School of Electronics and Display Engineering, Hoseo University, Asan, South Korea

SeoungGyun Kima School of Electronics and Display Engineering, Hoseo University, Asan, South KoreaView further author information

SeoJin Kanga School of Electronics and Display Engineering, Hoseo University, Asan, South KoreaView further author information

HyuckSu Leea School of Electronics and Display Engineering, Hoseo University, Asan, South KoreaView further author information

SeungJae Moona School of Electronics and Display Engineering, Hoseo University, Asan, South KoreaView further author information

JongMo Leea School of Electronics and Display Engineering, Hoseo University, Asan, South KoreaView further author information

ByungSeong Baea School of Electronics and Display Engineering, Hoseo University, Asan, South KoreaCorrespondence[email protected]

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