Journal of Information Display
Volume 24, 2023 - Issue 3
Open access
1,516
Views
0
CrossRef citations to date
0
Altmetric
Articles
Serially connected tantalum and amorphous indium tin oxide for sensing the temperature increase in IGZO thin-film transistor backplanes
EunSeong Yua School of Electronics and Display Engineering, Hoseo University, Asan, South Korea
https://orcid.org/0000-0002-2140-8721View further author information
SeoungGyun Kima School of Electronics and Display Engineering, Hoseo University, Asan, South KoreaView further author information
, SeoJin Kanga School of Electronics and Display Engineering, Hoseo University, Asan, South KoreaView further author information
, HyuckSu Leea School of Electronics and Display Engineering, Hoseo University, Asan, South KoreaView further author information
, SeungJae Moona School of Electronics and Display Engineering, Hoseo University, Asan, South KoreaView further author information
, JongMo Leea School of Electronics and Display Engineering, Hoseo University, Asan, South KoreaView further author information
, SeungBae Anb TSE Co., Ltd, Cheonan, South KoreaView further author information
& ByungSeong Baea School of Electronics and Display Engineering, Hoseo University, Asan, South KoreaCorrespondence[email protected]
https://orcid.org/0000-0002-3328-0286View further author information
Pages 205-213
|
Received 06 Dec 2022, Accepted 16 Feb 2023, Published online: 08 Mar 2023
Reprints and Permissions
This is an open access article distributed under the terms of the Creative Commons CC BY license, which permits unrestricted use, distribution, reproduction in any medium, provided the original work is properly cited.
You are not required to obtain permission to reuse this article in part or whole.
Related research
People also read lists articles that other readers of this article have read.
Recommended articles lists articles that we recommend and is powered by our AI driven recommendation engine.
Cited by lists all citing articles based on Crossref citations.
Articles with the Crossref icon will open in a new tab.