Improved Accuracy of Multicomponent Samples Analysis by X-Ray Fluorescence Using Relative Intensities and Scattered Radiation: A Review

Abstract

X-ray fluorescence is one of the best approaches for nondestructive elemental analysis and is consequently widely used in industry and science. Among the main problems for its application are matrix effects and a significant content of unidentified undetectable light elements, which influence the results and may be difficult to take into account. Several approaches have been proposed for solving these problems, including those based on the use of intensity ratios and the primary radiation scattered by the sample, which often allow one to achieve satisfactory accuracy using only a few reference samples. The goal of this review is to compare these approaches, discuss their advantages and disadvantages, and highlight the prospects for their further development.

Keywords:

• Light elements
• scattered radiation
• X-ray fluorescence (XRF)