Figures & data
Figure 1. A scanning electron microscopy (SEM) image of BSi used in this study. A top view of the surface (top left), a cross-sectional of the pillars (top right), and another cross-sectional view of the surface. Dust particles are impaled by the pillars (bottom).
![Figure 1. A scanning electron microscopy (SEM) image of BSi used in this study. A top view of the surface (top left), a cross-sectional of the pillars (top right), and another cross-sectional view of the surface. Dust particles are impaled by the pillars (bottom).](/cms/asset/6fc707d5-e086-4ac0-80c9-7b3c43768b86/uast_a_1861211_f0001_c.jpg)
Figure 3. SEM of the deposition characteristics of fluorescent particles of different sizes on Si and BSi surfaces.
![Figure 3. SEM of the deposition characteristics of fluorescent particles of different sizes on Si and BSi surfaces.](/cms/asset/28b0c448-0a09-474e-9d18-d783551004c1/uast_a_1861211_f0003_c.jpg)
Figure 4. The local collection efficiency on a 0.75 mm2 surface area, based on optical microscopy images, for investigations of fluorescent particles on the primary impaction zone of a silicon surface.
![Figure 4. The local collection efficiency on a 0.75 mm2 surface area, based on optical microscopy images, for investigations of fluorescent particles on the primary impaction zone of a silicon surface.](/cms/asset/89ad153c-90ef-4a6b-84d3-f42c8d797a9c/uast_a_1861211_f0004_c.jpg)
Figure 6. Schematic illustrations of rebound and re-entrainment theory. (Adapted from Paw U Citation1983.)
![Figure 6. Schematic illustrations of rebound and re-entrainment theory. (Adapted from Paw U Citation1983.)](/cms/asset/7870aedc-0b87-4309-8316-da6cc3bf0995/uast_a_1861211_f0006_c.jpg)
Table 1. A summary of the deposition characteristics of the particles.