Transcriptome analysis of soybean roots in response to boron deficiency

Figures & data

Table 1. Number of reads sequenced and mapped to soybean genome.

Sample	Raw read	Raw bases	Clean read	Clean bases	Clean data %	Total mapped reads (%)	Q30 (%)
CK1	41771507	6265726100	38354457	5753168500	91.82	94.15	93.14
CK2	46227858	6934178700	42844032	6426604800	92.67	92.39	93.35
CK3	42632930	6394939500	39373021	5905953200	92.35	91.93	92.26
CK4	44408899	6661334800	40975200	6146280000	92.25	94.05	93.49
T1	41214885	6182232700	38032059	5704808800	92.28	93.33	93.29
T2	45821358	6873203700	42031437	6304715600	91.74	94.31	93.22
T3	44897340	6734601000	41393567	6209035100	92.21	92.25	93.15
T4	43244759	6486713800	39936916	5990537400	92.34	93.26	93.58

The B-deficient variants (without H₃BO₃) as treatment, were numbered T1, T2, T3 and T4 respectively, corresponding to the B-sufficient variants (with H₃BO₃) as control, were numbered CK1, CK2, CK3 and CK4, respectively.

Figure 1. Soybean seedlings under B-deficiency (without 0.045 mmol L⁻¹ H₃BO₃) and B-sufficiency (with 0.045 mmol L⁻¹ H₃BO₃) conditions. The seedlings were cultivated for 12 h, 24 h, 72 h and 8 days in hydroponic culture systems.

Figure 2. Physiological responses of soybean seedlings to B deficiency. (a) Plant height of soybean (cm). (b) SPAD values. (c) The Fv/Fm values of chlorophyll fluorescence. Different letters indicate significant differences at p < 0.05 according to Duncan’s multiple comparison tests.

Figure 3. DEGs in soybean under B deficiency. (a) Number of DEGs at each time point. (b) Venn diagram showing the distribution of DEGs at each time point (p value <0.05). CK, control; T, B deficiency treatment; numbers 1–4 represent the four sampling time points, 12 h, 24 h, 72 h and 8 days, respectively.

Figure 6. ( A) Performance of FPKM values of 15 DEGs determined from the RNA-seq; (B) Expression of 18 DEGs in qRT-PCR.

Data availability statement

The data that support the findings of this study are available from the corresponding authors, Li, Q., Su, E. H. and Fan, L., upon reasonable request.