Figures & data
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Figure 1. Surface and cross-sectional morphologies of as-deposited Ag-ITO films with different silver contents, obtained from (a)–(c): Cross-sectional SEM (insets: schematic of the distributions for Ag and ITO particles and different growth stages); (f)–(h): Surface SEM (insets: AFM images) and (d)–(e): TEM.
![Figure 1. Surface and cross-sectional morphologies of as-deposited Ag-ITO films with different silver contents, obtained from (a)–(c): Cross-sectional SEM (insets: schematic of the distributions for Ag and ITO particles and different growth stages); (f)–(h): Surface SEM (insets: AFM images) and (d)–(e): TEM.](/cms/asset/8403d4ee-5b1b-4b8b-9ad3-d977d5075795/tsta_a_1432230_f0001_oc.gif)
Figure 2. XRD patterns of Ag-ITO films with different silver contents compared with pure ITO films under identical fabrication conditions (see labels for details).
![Figure 2. XRD patterns of Ag-ITO films with different silver contents compared with pure ITO films under identical fabrication conditions (see labels for details).](/cms/asset/0f6ae7f1-0ac4-4759-8468-1944a3753fcf/tsta_a_1432230_f0002_oc.gif)
Figure 3. Wide range of λ c and ENZ tuning can be achieved by optimizing the silver content and post-annealing parameters: (a) Real permittivity for Ag-ITO films (inset: real permittivity for pure ITO films); (b) Imaginary permittivity; (c) Hall measurements for the annealed films (inset: as-deposited films); (d) Experimental data and linear fitting of λ c vs. square root of carrier concentration.
![Figure 3. Wide range of λ c and ENZ tuning can be achieved by optimizing the silver content and post-annealing parameters: (a) Real permittivity for Ag-ITO films (inset: real permittivity for pure ITO films); (b) Imaginary permittivity; (c) Hall measurements for the annealed films (inset: as-deposited films); (d) Experimental data and linear fitting of λ c vs. square root of carrier concentration.](/cms/asset/cccf9fc4-bd85-40e4-9917-92824bda02b8/tsta_a_1432230_f0003_oc.gif)
Figure 4. ENZ region for Ag-ITO films with different silver contents: (a) Experimental data of as-deposited Ag-ITO films; (b) Experimental data of annealed Ag-ITO films; (c) Effective medium approximation based on extended Maxwell-Garnett model which takes silver and ITO as constituents and air as host.
![Figure 4. ENZ region for Ag-ITO films with different silver contents: (a) Experimental data of as-deposited Ag-ITO films; (b) Experimental data of annealed Ag-ITO films; (c) Effective medium approximation based on extended Maxwell-Garnett model which takes silver and ITO as constituents and air as host.](/cms/asset/2cec52fc-3d7c-4741-92e1-838e3d045e82/tsta_a_1432230_f0004_oc.gif)
Figure 5. Reflectance curves for annealed Ag-ITO films vs. incident angle at the wavelength of 1550 nm: (a) Schematic of the prism-coupling configuration; (b)–(d) Experimental results by prism-coupling; and simulation by transfer-matrix method for sample 1, 2, and 3, respectively.
![Figure 5. Reflectance curves for annealed Ag-ITO films vs. incident angle at the wavelength of 1550 nm: (a) Schematic of the prism-coupling configuration; (b)–(d) Experimental results by prism-coupling; and simulation by transfer-matrix method for sample 1, 2, and 3, respectively.](/cms/asset/8ac6404a-1f5e-4421-8f82-b735016f046f/tsta_a_1432230_f0005_oc.gif)