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Focus on Advancements of Functional Materials with Nanoarchitectonics as Post-Nanotechnology Concept in Materials Science

Metal doped polyaniline as neuromorphic circuit elements for in-materia computing

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Article: 2178815 | Received 25 Jan 2023, Accepted 06 Feb 2023, Published online: 27 Feb 2023

Figures & data

Figure 1. Chemical structure of polyaniline.

Figure 1. Chemical structure of polyaniline.

Figure 2. (a) Device architecture for Type I: Cu2+- doped devices; (b) I-V response to ± 0.6 V input at 1 hz sweep rate; (c, d) Conductance response of pulsed inputs of width (W) = 0.05 s at intervals (T) = 1 s for voltage amplitudes (V) = 1.5 V (c, STM) or 0.3 V (d, LTM).

Figure 2. (a) Device architecture for Type I: Cu2+- doped devices; (b) I-V response to ± 0.6 V input at 1 hz sweep rate; (c, d) Conductance response of pulsed inputs of width (W) = 0.05 s at intervals (T) = 1 s for voltage amplitudes (V) = 1.5 V (c, STM) or 0.3 V (d, LTM).

Figure 3. (a) Device architecture for Type II: Ag+- doped devices; (b) I-V response to ± 0.6 V input at 1 hz sweep rate.; (c – f) conductance response pulsed input. (c) input voltage (V) = 0.4 V, pulse width (W) = 0.5 s, interval (T) = 0.5 s; (d) V = 0.6 V, W = 0.5 s, T = 0.5 s; (e) V = 2.9 V, W = 0.1 s, T = 2 s; (f) V = 2.9 V, W = 0.1 s, T = 0.2 s.

Figure 3. (a) Device architecture for Type II: Ag+- doped devices; (b) I-V response to ± 0.6 V input at 1 hz sweep rate.; (c – f) conductance response pulsed input. (c) input voltage (V) = 0.4 V, pulse width (W) = 0.5 s, interval (T) = 0.5 s; (d) V = 0.6 V, W = 0.5 s, T = 0.5 s; (e) V = 2.9 V, W = 0.1 s, T = 2 s; (f) V = 2.9 V, W = 0.1 s, T = 0.2 s.

Figure 4. (a) Magnified region of the pulse response for Type-II devices (Figure 1d). (b) Histogram of G0 fitted by Gaussian curve (blue line). The number corresponds to each step observed in the change of conductance.

Figure 4. (a) Magnified region of the pulse response for Type-II devices (Figure 1d). (b) Histogram of G0 fitted by Gaussian curve (blue line). The number corresponds to each step observed in the change of conductance.

Figure 5. (a-b) Temperature dependence of resistance the on states. (c) Proposed mechanism of resistive switching for metal ion-doped device.

Figure 5. (a-b) Temperature dependence of resistance the on states. (c) Proposed mechanism of resistive switching for metal ion-doped device.
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