Figures & data
Table 1. Physical property, Microstructure, and XRD parameters of the (1-x)BNT-xBMT ceramics analysis by SmartLab Studio II
Figure 2. Plots of density value as a function of sintering temperature (1100–1200°C) of the (1-x)BNT-xBMT ceramics.
![Figure 2. Plots of density value as a function of sintering temperature (1100–1200°C) of the (1-x)BNT-xBMT ceramics.](/cms/asset/d119f4f3-d9d5-4d13-ba8b-e1961360d09d/tace_a_2076362_f0002_oc.jpg)
Figure 4. X-ray diffraction patterns of the (1-x)BNT-xBMT ceramics where x = 0–0.20 with 2θ = 20–80°, 39–41°, and 2θ = 45–48°.
![Figure 4. X-ray diffraction patterns of the (1-x)BNT-xBMT ceramics where x = 0–0.20 with 2θ = 20–80°, 39–41°, and 2θ = 45–48°.](/cms/asset/2837980e-f4ea-4c39-b9c7-85e6633859da/tace_a_2076362_f0004_oc.jpg)
Figure 5. Plots of (a) unit cell volume and tolerance factor (t) values as a function of the BMT content, and (b) the rA and rB as a function of the BMT content of the (1-x)BNT-xBMT ceramics.
![Figure 5. Plots of (a) unit cell volume and tolerance factor (t) values as a function of the BMT content, and (b) the rA and rB as a function of the BMT content of the (1-x)BNT-xBMT ceramics.](/cms/asset/9e908311-bd91-40c6-b036-70ecd5a2e2dd/tace_a_2076362_f0005_oc.jpg)
Figure 6. Raman spectra of the (1-x)BNT-xBMT ceramics measured at room temperature (RT) in the wavenumber range of 100–1400 cm−1.
![Figure 6. Raman spectra of the (1-x)BNT-xBMT ceramics measured at room temperature (RT) in the wavenumber range of 100–1400 cm−1.](/cms/asset/c760059d-2317-400b-af46-92b3484fe6c9/tace_a_2076362_f0006_oc.jpg)
Table 2. Microstructure, dielectric, ferroelectric, and electric field-induced strain properties of the (1-x)BNT-xBMT ceramics
Figure 7. SEM micrographs with as sintered surfaces of the (1-x)BNT-xBMT ceramics where (a) x = 0, (b) x = 0.05, (c) x = 0.10, (d) x = 0.15, (e) x = 0.20, and (f) grain size as a function of BMT content.
![Figure 7. SEM micrographs with as sintered surfaces of the (1-x)BNT-xBMT ceramics where (a) x = 0, (b) x = 0.05, (c) x = 0.10, (d) x = 0.15, (e) x = 0.20, and (f) grain size as a function of BMT content.](/cms/asset/efa4267e-07c2-4f49-a0d9-3dd547a5ee63/tace_a_2076362_f0007_oc.jpg)
Figure 8. Temperature dependence of the dielectric constant (εr) and dielectric loss (tan δ) of the (1-x)BNT-xBMT ceramics measured at various frequencies from 1–500 kHz where (a) x = 0, (b) x = 0.05, (c) x = 0.10, (d) x = 0.15 (e) x = 0.20, and (f) plot of Tm and εmax values as a function of BMT content (inset: δA as a function of the BMT content).
![Figure 8. Temperature dependence of the dielectric constant (εr) and dielectric loss (tan δ) of the (1-x)BNT-xBMT ceramics measured at various frequencies from 1–500 kHz where (a) x = 0, (b) x = 0.05, (c) x = 0.10, (d) x = 0.15 (e) x = 0.20, and (f) plot of Tm and εmax values as a function of BMT content (inset: δA as a function of the BMT content).](/cms/asset/969fdd48-af09-4169-91bb-79fbbd4b4778/tace_a_2076362_f0008_oc.jpg)
Figure 9. Polarization-electric field (P-E) hysteresis loop and current-electric field (I-E) data of the (1-x)BNT-xBMT ceramics, measured at 50 kV/cm and a frequency of 1 Hz where (a) x = 0, (b) x = 0.05, (c) x = 0.10,(d) x = 0.15, (e) x = 0.20, and (f) plot of Pr and Ec values as a function of BMT content.
![Figure 9. Polarization-electric field (P-E) hysteresis loop and current-electric field (I-E) data of the (1-x)BNT-xBMT ceramics, measured at 50 kV/cm and a frequency of 1 Hz where (a) x = 0, (b) x = 0.05, (c) x = 0.10,(d) x = 0.15, (e) x = 0.20, and (f) plot of Pr and Ec values as a function of BMT content.](/cms/asset/fa70f186-b009-413e-b08f-b72d7c0ad339/tace_a_2076362_f0009_oc.jpg)
Figure 10. Temperature dependence on polarization-electric field (P-E) hysteresis loops of the (1-x)BNT-xBMT ceramics where x = 0–0.20, measured under an electric field of 50 kV/cm and a frequency of 1 Hz.
![Figure 10. Temperature dependence on polarization-electric field (P-E) hysteresis loops of the (1-x)BNT-xBMT ceramics where x = 0–0.20, measured under an electric field of 50 kV/cm and a frequency of 1 Hz.](/cms/asset/cbbb49e4-2620-4760-ae6c-9b1112826cad/tace_a_2076362_f0010_oc.jpg)
Table 3. Energy storage density, piezoelectric, and energy harvesting properties of the (1-x)BNT-xBMT ceramics
Figure 11. Plots of (a) Wrec as a function of temperature @ E = 50 kV, (b) η as a function of temperature @ E = 50 kV, (c) Wrec @ 125°C as a function of the electric field (until breakdown strength reached), and (d) Wrec @ 125°C as a function of BMT content and measured under E = 50 kV and E= Emax of the (1-x)BNT-xBMT ceramics.
![Figure 11. Plots of (a) Wrec as a function of temperature @ E = 50 kV, (b) η as a function of temperature @ E = 50 kV, (c) Wrec @ 125°C as a function of the electric field (until breakdown strength reached), and (d) Wrec @ 125°C as a function of BMT content and measured under E = 50 kV and E= Emax of the (1-x)BNT-xBMT ceramics.](/cms/asset/28c1244b-808d-4f2a-ac9a-ef1ed84b7e41/tace_a_2076362_f0011_oc.jpg)
Figure 12. Bipolar strain-electric field (S-E) data of the (1-x)BNT-xBMT ceramics, measured under electric field of 70 kV/cm and a frequency of 0.1 Hz where (a) x = 0, (b) x = 0.05, (c) x = 0.10,(d) x = 0.15, (e) x = 0.20, and (f) plot of Smax and d*33 values as a function of BMT content.
![Figure 12. Bipolar strain-electric field (S-E) data of the (1-x)BNT-xBMT ceramics, measured under electric field of 70 kV/cm and a frequency of 0.1 Hz where (a) x = 0, (b) x = 0.05, (c) x = 0.10,(d) x = 0.15, (e) x = 0.20, and (f) plot of Smax and d*33 values as a function of BMT content.](/cms/asset/09056238-4ad8-4af2-a2d2-fc78ea28c0ba/tace_a_2076362_f0012_oc.jpg)