Figures & data
Figure 2. SEM analysis at magnification levels (a) 1000× and FR4 point selection for element identification tool (b), 3300× and PLA_PCB_0.15 point selection for element identification tool.
![Figure 2. SEM analysis at magnification levels (a) 1000× and FR4 point selection for element identification tool (b), 3300× and PLA_PCB_0.15 point selection for element identification tool.](/cms/asset/4eb34a93-a635-4fad-862b-d5d00ac81f3c/tems_a_2318374_f0002_c.jpg)
Table 1. Elemental composition of selected points by EDS.
Table 2. Tg, Tc, and Tm of pure and composite filaments.
Table 3. Xc of pure and composite filaments.
Table 4. Mean E, σ, and ε of pure and composite filaments – tension tests.
Table 5. Mean Ef and σf of pure and composite filaments – 3-point-bending tests.
Table A.1. Printer and filament settings.
Table C.1. Width of samples (b) and thickness of samples (d).