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Ferroelectrics Volume 541, 2019 - Issue 1: Proceedings of SPM-2018 and IWMN-2018, Part I of II
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Articles

Scanning capacitance microscopy of TGS − TGS + Cr ferroelectric crystals

R. V. GainutdinovShubnikov Institute of Crystallography of Federal Scientific Research Center “Crystallography and Photonics”, Russian Academy of Sciences, Moscow, Russia; Correspondence[email protected]
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N. V. BeluginaShubnikov Institute of Crystallography of Federal Scientific Research Center “Crystallography and Photonics”, Russian Academy of Sciences, Moscow, Russia; View further author information
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A. K. LashkovaShubnikov Institute of Crystallography of Federal Scientific Research Center “Crystallography and Photonics”, Russian Academy of Sciences, Moscow, Russia; View further author information
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V. N. ShutInstitute of Technical Acoustic, The National Academy of Sciences of Belarus, Vitebsk, Belarus; View further author information
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I. F. KashevichVitebsk State University, Department of Mathematics and IT, Vitebsk, BelarusView further author information
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S. E. MozzharovInstitute of Technical Acoustic, The National Academy of Sciences of Belarus, Vitebsk, Belarus; View further author information
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A. L. TolstikhinaShubnikov Institute of Crystallography of Federal Scientific Research Center “Crystallography and Photonics”, Russian Academy of Sciences, Moscow, Russia; View further author information
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Pages 39-46 | Received 29 Aug 2018, Accepted 26 Nov 2018, Published online: 09 Jul 2019
 
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Abstract

The question of the applicability of the scanning capacitive microscopy method for the composite mapping of ferroelectric crystals with the growth periodic structure TGS – TGS + Cr is considered. Contrast images of nominally pure stripes and impurity ones with concentration of Cr+3 ∼0.08 wt% were obtained. Volt-ampere characteristics were measured, which revealed current increase in the impurity stripes in 1.5–3 times. It was shown that capacitive contrast was formed in the stripes with a gradient of impurity concentration and at the domain boundaries.

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Funding

This work was supported by the Ministry of Science and Higher Education within the State assignment FSRC ≪Crystallography and Photonics≫ RAS.

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